|
US3980891A
(en)
*
|
1975-05-16 |
1976-09-14 |
Intec Corporation |
Method and apparatus for a rotary scanner flaw detection system
|
|
US4170419A
(en)
*
|
1977-02-23 |
1979-10-09 |
Camsco, Inc. |
Optical web inspection system
|
|
US4237539A
(en)
*
|
1977-11-21 |
1980-12-02 |
E. I. Du Pont De Nemours And Company |
On-line web inspection system
|
|
US4219277A
(en)
*
|
1978-08-09 |
1980-08-26 |
Westinghouse Electric Corp. |
Method of detecting flaws on surfaces
|
|
US4253768A
(en)
*
|
1978-08-09 |
1981-03-03 |
Westinghouse Electric Corp. |
Processing system for detection and the classification of flaws on metallic surfaces
|
|
US4247204A
(en)
*
|
1979-02-26 |
1981-01-27 |
Intec Corporation |
Method and apparatus for a web edge tracking flaw detection system
|
|
US4265545A
(en)
*
|
1979-07-27 |
1981-05-05 |
Intec Corporation |
Multiple source laser scanning inspection system
|
|
US4297587A
(en)
*
|
1980-03-07 |
1981-10-27 |
Intec Corporation |
Absolute DC system for a laser inspection system
|
|
US4376583A
(en)
*
|
1981-05-12 |
1983-03-15 |
Aeronca Electronics, Inc. |
Surface inspection scanning system
|
|
US4488648A
(en)
*
|
1982-05-06 |
1984-12-18 |
Powers Manufacturing, Inc. |
Flaw detector
|
|
DE3325136C1
(de)
*
|
1983-07-12 |
1984-11-22 |
Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch |
Fehlersuchgerät für Bahnen
|
|
DE3334357C2
(de)
*
|
1983-09-22 |
1986-04-10 |
Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch |
Optisches Fehlersuchgerät für Bahnen
|
|
US5068799A
(en)
*
|
1985-04-24 |
1991-11-26 |
Jarrett Jr Harold M |
System and method for detecting flaws in continuous web materials
|
|
US4719061A
(en)
*
|
1985-08-12 |
1988-01-12 |
Essex Group, Inc. |
System and method for in-process detection of contamination in electrical conductor insulation
|
|
US4756855A
(en)
*
|
1986-04-04 |
1988-07-12 |
Phillips Petroleum Company |
Automatic method for sorting plastic pellets
|
|
US4800503A
(en)
*
|
1986-09-19 |
1989-01-24 |
Burlington Industries, Inc. |
Method and apparatus for grading fabrics
|
|
US5243407A
(en)
*
|
1986-11-12 |
1993-09-07 |
Measurex Corporation |
On-line paper sheet formation characterizing method and device
|
|
US5092678A
(en)
*
|
1986-11-12 |
1992-03-03 |
Measurex Corporation |
On-line sheet formation characterizing method and device
|
|
US4824250A
(en)
*
|
1986-11-17 |
1989-04-25 |
Newman John W |
Non-destructive testing by laser scanning
|
|
US5121138A
(en)
*
|
1990-05-22 |
1992-06-09 |
General Scanning, Inc. |
Resonant scanner control system
|
|
US6255666B1
(en)
*
|
1992-12-03 |
2001-07-03 |
Brown & Sharpe Surface Inspection Systems, Inc. |
High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor
|
|
US6252242B1
(en)
*
|
1992-12-03 |
2001-06-26 |
Brown & Sharpe Surface Inspection Systems, Inc. |
High speed optical inspection apparatus using Gaussian distribution analysis and method therefore
|
|
US6294793B1
(en)
*
|
1992-12-03 |
2001-09-25 |
Brown & Sharpe Surface Inspection Systems, Inc. |
High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor
|
|
US5556764A
(en)
*
|
1993-02-17 |
1996-09-17 |
Biometric Imaging, Inc. |
Method and apparatus for cell counting and cell classification
|
|
US5448364A
(en)
*
|
1993-03-22 |
1995-09-05 |
Estek Corporation |
Particle detection system with reflective line-to-spot collector
|
|
DE69530323T2
(de)
*
|
1994-09-02 |
2004-02-12 |
BD Biosciences, Systems and Reagents, Inc., San Jose |
Verfahren und vorrichtung zur eichung eines optischen abtasters
|
|
FR2796462B1
(fr)
*
|
1999-07-15 |
2001-09-07 |
Eastman Kodak Co |
Procede et dispositif de detection d'un defaut dans une nappe liquide
|
|
US6831736B2
(en)
*
|
2002-10-07 |
2004-12-14 |
Applied Materials Israel, Ltd. |
Method of and apparatus for line alignment to compensate for static and dynamic inaccuracies in scanning
|
|
US8057463B2
(en)
*
|
2006-04-07 |
2011-11-15 |
Amo Development, Llc. |
Adaptive pattern correction for laser scanners
|
|
US10060861B2
(en)
*
|
2017-01-10 |
2018-08-28 |
Sunspring America, Inc. |
Technologies for identifying defects
|