JPS5530019B2 - - Google Patents
Info
- Publication number
- JPS5530019B2 JPS5530019B2 JP1284672A JP1284672A JPS5530019B2 JP S5530019 B2 JPS5530019 B2 JP S5530019B2 JP 1284672 A JP1284672 A JP 1284672A JP 1284672 A JP1284672 A JP 1284672A JP S5530019 B2 JPS5530019 B2 JP S5530019B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1284672A JPS5530019B2 (en) | 1972-02-07 | 1972-02-07 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1284672A JPS5530019B2 (en) | 1972-02-07 | 1972-02-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS4881937A JPS4881937A (en) | 1973-11-01 |
JPS5530019B2 true JPS5530019B2 (en) | 1980-08-07 |
Family
ID=11816741
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1284672A Expired JPS5530019B2 (en) | 1972-02-07 | 1972-02-07 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5530019B2 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2017138238A1 (en) | 2016-02-09 | 2017-08-17 | オムロン株式会社 | Monitoring device, and method for controlling monitoring device |
WO2018070388A1 (en) | 2016-10-12 | 2018-04-19 | オムロン株式会社 | Operation state monitoring device, and learning data generation device, method, and program |
US20180231969A1 (en) * | 2015-08-05 | 2018-08-16 | Hitachi Power Solutions Co., Ltd. | Abnormality predictor diagnosis system and abnormality predictor diagnosis method |
WO2018158704A1 (en) | 2017-02-28 | 2018-09-07 | Omron Corporation | Work management apparatus, method, and program |
US20200198128A1 (en) * | 2018-12-21 | 2020-06-25 | Fanuc Corporation | Learning data confirmation support device, machine learning device, and failure predicting device |
US10839043B2 (en) | 2016-02-09 | 2020-11-17 | Omron Corporation | Monitoring device, method and computer-readable recording medium for controlling monitoring device |
US20210065023A1 (en) * | 2019-08-26 | 2021-03-04 | Kabushiki Kaisha Toshiba | Abnormality determination device, learning device, and abnormality determination method |
US11119141B2 (en) | 2007-09-18 | 2021-09-14 | Georgia Tech Research Corporation | Detecting actuation of electrical devices using electrical noise over a power line |
-
1972
- 1972-02-07 JP JP1284672A patent/JPS5530019B2/ja not_active Expired
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11119141B2 (en) | 2007-09-18 | 2021-09-14 | Georgia Tech Research Corporation | Detecting actuation of electrical devices using electrical noise over a power line |
US20180231969A1 (en) * | 2015-08-05 | 2018-08-16 | Hitachi Power Solutions Co., Ltd. | Abnormality predictor diagnosis system and abnormality predictor diagnosis method |
WO2017138238A1 (en) | 2016-02-09 | 2017-08-17 | オムロン株式会社 | Monitoring device, and method for controlling monitoring device |
US10678887B2 (en) | 2016-02-09 | 2020-06-09 | Omron Corporation | Monitoring device, method and computer-readable recording medium for controlling monitoring device |
US10839043B2 (en) | 2016-02-09 | 2020-11-17 | Omron Corporation | Monitoring device, method and computer-readable recording medium for controlling monitoring device |
WO2018070388A1 (en) | 2016-10-12 | 2018-04-19 | オムロン株式会社 | Operation state monitoring device, and learning data generation device, method, and program |
WO2018158704A1 (en) | 2017-02-28 | 2018-09-07 | Omron Corporation | Work management apparatus, method, and program |
US20200198128A1 (en) * | 2018-12-21 | 2020-06-25 | Fanuc Corporation | Learning data confirmation support device, machine learning device, and failure predicting device |
US20210065023A1 (en) * | 2019-08-26 | 2021-03-04 | Kabushiki Kaisha Toshiba | Abnormality determination device, learning device, and abnormality determination method |
US11526783B2 (en) * | 2019-08-26 | 2022-12-13 | Kabushiki Kaisha Toshiba | Abnormality determination device, learning device, and abnormality determination method |
Also Published As
Publication number | Publication date |
---|---|
JPS4881937A (en) | 1973-11-01 |