JPS5525385B2 - - Google Patents
Info
- Publication number
- JPS5525385B2 JPS5525385B2 JP9600672A JP9600672A JPS5525385B2 JP S5525385 B2 JPS5525385 B2 JP S5525385B2 JP 9600672 A JP9600672 A JP 9600672A JP 9600672 A JP9600672 A JP 9600672A JP S5525385 B2 JPS5525385 B2 JP S5525385B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9600672A JPS5525385B2 (en:Method) | 1972-09-25 | 1972-09-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9600672A JPS5525385B2 (en:Method) | 1972-09-25 | 1972-09-25 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4953381A JPS4953381A (en:Method) | 1974-05-23 |
| JPS5525385B2 true JPS5525385B2 (en:Method) | 1980-07-05 |
Family
ID=14153044
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9600672A Expired JPS5525385B2 (en:Method) | 1972-09-25 | 1972-09-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5525385B2 (en:Method) |
-
1972
- 1972-09-25 JP JP9600672A patent/JPS5525385B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS4953381A (en:Method) | 1974-05-23 |