JPS5518875B2 - - Google Patents

Info

Publication number
JPS5518875B2
JPS5518875B2 JP10402576A JP10402576A JPS5518875B2 JP S5518875 B2 JPS5518875 B2 JP S5518875B2 JP 10402576 A JP10402576 A JP 10402576A JP 10402576 A JP10402576 A JP 10402576A JP S5518875 B2 JPS5518875 B2 JP S5518875B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10402576A
Other languages
Japanese (ja)
Other versions
JPS5329787A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10402576A priority Critical patent/JPS5329787A/ja
Priority to US05/828,811 priority patent/US4186307A/en
Priority to CA285,776A priority patent/CA1067214A/en
Publication of JPS5329787A publication Critical patent/JPS5329787A/ja
Publication of JPS5518875B2 publication Critical patent/JPS5518875B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Nuclear Medicine (AREA)
JP10402576A 1976-08-31 1976-08-31 Measuring device for radiation Granted JPS5329787A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP10402576A JPS5329787A (en) 1976-08-31 1976-08-31 Measuring device for radiation
US05/828,811 US4186307A (en) 1976-08-31 1977-08-29 Radiation measuring apparatus employing variable rate pulse sampling control
CA285,776A CA1067214A (en) 1976-08-31 1977-08-30 Radiation-measuring apparatus employing variable rate pulse sampling control

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10402576A JPS5329787A (en) 1976-08-31 1976-08-31 Measuring device for radiation

Publications (2)

Publication Number Publication Date
JPS5329787A JPS5329787A (en) 1978-03-20
JPS5518875B2 true JPS5518875B2 (ref) 1980-05-22

Family

ID=14369706

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10402576A Granted JPS5329787A (en) 1976-08-31 1976-08-31 Measuring device for radiation

Country Status (3)

Country Link
US (1) US4186307A (ref)
JP (1) JPS5329787A (ref)
CA (1) CA1067214A (ref)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4455616A (en) * 1979-07-09 1984-06-19 Elscint, Ltd. Fast gamma camera
US4421986A (en) * 1980-11-21 1983-12-20 The United States Of America As Represented By The Department Of Health And Human Services Nuclear pulse discriminator
US4413183A (en) * 1980-12-29 1983-11-01 Raytheon Company Gamma camera
JPS59122987A (ja) * 1982-12-29 1984-07-16 Shimadzu Corp 放射線パルス測定回路
JPS59141083A (ja) * 1983-01-31 1984-08-13 Shimadzu Corp 放射線結像装置
FR2540995B1 (fr) * 1983-02-14 1985-09-27 Labo Electronique Physique Dispositif de mesure de radiations a scintillateur et tube photomultiplicateur, et camera a scintillation equipee d'un tel dispositif
FR2552233B1 (fr) * 1983-09-16 1987-06-26 Labo Electronique Physique Dispositif de mesure de radiations et camera a scintillation equipee d'un tel dispositif
US4973913A (en) * 1990-02-08 1990-11-27 Mitsubishi Denki Kabushiki Kaisha Radiation measuring apparatus
DE4029335A1 (de) * 1990-09-15 1992-03-19 Philips Patentverwaltung Schaltungsanordnung zum kommutieren eines reluktanzmotors
JP3041086B2 (ja) * 1991-07-03 2000-05-15 オリンパス光学工業株式会社 管腔内挿入用放射線検出装置
US6297506B1 (en) * 2000-03-23 2001-10-02 John W. Young System and method for reducing pile-up errors in multi-crystal gamma ray detector applications
ITPI20040078A1 (it) * 2004-10-18 2005-01-18 I S E Ingegneria Dei Sistemi E Metodo ed apparecchiatura per il trattamento dei segnali generati da tubi fotomoltiplicatori
US7279685B2 (en) * 2005-09-22 2007-10-09 Trevor Murdoch Radiation detector
US9354351B2 (en) * 2011-05-17 2016-05-31 Schlumberger Technology Corporation High throughput pulse height analyzer
EP2544025A1 (en) * 2011-07-07 2013-01-09 FEI Company Silicon Drift Detector for use in a charged particle apparatus
JP6628701B2 (ja) * 2016-08-05 2020-01-15 三菱電機株式会社 放射線測定装置
CN119224404B (zh) * 2024-09-30 2025-03-11 中南兰信(南京)辐射技术研究院有限公司 一种通过辐射监测器的静电计测量电流方法及系统

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4051373A (en) * 1974-06-11 1977-09-27 Picker Corporation Delay line clipping in a scintillation camera system

Also Published As

Publication number Publication date
US4186307A (en) 1980-01-29
JPS5329787A (en) 1978-03-20
CA1067214A (en) 1979-11-27

Similar Documents

Publication Publication Date Title
DK60277A (ref)
DK139006C (ref)
FR2376368B1 (ref)
DE2760279A1 (ref)
DK505076A (ref)
JPS5518875B2 (ref)
DK508977A (ref)
FI53267B (ref)
DE2654377B2 (ref)
JPS5520930B2 (ref)
FR2356614B1 (ref)
FR2352938B1 (ref)
JPS5345768U (ref)
FI53253C (ref)
FI53532B (ref)
JPS5612840Y2 (ref)
JPS52128155U (ref)
CS177445B1 (ref)
FI760668A7 (ref)
JPS52106808U (ref)
JPS52144438U (ref)
JPS52170775U (ref)
JPS5295023U (ref)
DK552777A (ref)
JPS5312929U (ref)