JPS55177657U - - Google Patents
Info
- Publication number
- JPS55177657U JPS55177657U JP7864879U JP7864879U JPS55177657U JP S55177657 U JPS55177657 U JP S55177657U JP 7864879 U JP7864879 U JP 7864879U JP 7864879 U JP7864879 U JP 7864879U JP S55177657 U JPS55177657 U JP S55177657U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7864879U JPS55177657U (en:Method) | 1979-06-08 | 1979-06-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7864879U JPS55177657U (en:Method) | 1979-06-08 | 1979-06-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS55177657U true JPS55177657U (en:Method) | 1980-12-19 |
Family
ID=29312098
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7864879U Pending JPS55177657U (en:Method) | 1979-06-08 | 1979-06-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55177657U (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59113777U (ja) * | 1983-01-21 | 1984-08-01 | 株式会社アドバンテスト | Ｉｃ試験器用接触装置 |
-
1979
- 1979-06-08 JP JP7864879U patent/JPS55177657U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59113777U (ja) * | 1983-01-21 | 1984-08-01 | 株式会社アドバンテスト | Ｉｃ試験器用接触装置 |