JPS55174171U - - Google Patents
Info
- Publication number
- JPS55174171U JPS55174171U JP7496379U JP7496379U JPS55174171U JP S55174171 U JPS55174171 U JP S55174171U JP 7496379 U JP7496379 U JP 7496379U JP 7496379 U JP7496379 U JP 7496379U JP S55174171 U JPS55174171 U JP S55174171U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measurement Of Current Or Voltage (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7496379U JPS55174171U (ref) | 1979-06-01 | 1979-06-01 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7496379U JPS55174171U (ref) | 1979-06-01 | 1979-06-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS55174171U true JPS55174171U (ref) | 1980-12-13 |
Family
ID=29308525
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7496379U Pending JPS55174171U (ref) | 1979-06-01 | 1979-06-01 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55174171U (ref) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016024032A (ja) * | 2014-07-18 | 2016-02-08 | 三菱電機株式会社 | 利得試験器 |
-
1979
- 1979-06-01 JP JP7496379U patent/JPS55174171U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016024032A (ja) * | 2014-07-18 | 2016-02-08 | 三菱電機株式会社 | 利得試験器 |