JPS55166053A - Method of inspecting thin film capacitor - Google Patents
Method of inspecting thin film capacitorInfo
- Publication number
- JPS55166053A JPS55166053A JP7297979A JP7297979A JPS55166053A JP S55166053 A JPS55166053 A JP S55166053A JP 7297979 A JP7297979 A JP 7297979A JP 7297979 A JP7297979 A JP 7297979A JP S55166053 A JPS55166053 A JP S55166053A
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- infrared ray
- infinitesimal
- leakage current
- irradiated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To readily discriminate a thin film capacitor at low voltage application by imparting infinitesimal temperature change thereto by measuring the infinitesimal change of a leakage current occurred when an infrared ray is periodically irradiated to the capacitor to be inspected.
CONSTITUTION: A DC power supply 6 of several volts and an amplifier circuit 7 are connected first to a capacitor 5, and an infrared ray is intermittently irradiated to the capacitor. In this manner, the capacitor 5 varies at infinitesimal temperature change to thus cause infinitesimal change ΔIl of a leakage current. The smaller the infinitesimal change ΔIl of the leakage current is, the smaller the leakage current. The infrared ray is irradiated by an infrared ray heater 4 having an infrared ray load of 0.8kW and 630Hz, and is irradiated through a transmission window 1 of a rotary disk 2 to the capacitor 5 by a synchronous motor 3.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7297979A JPS55166053A (en) | 1979-06-12 | 1979-06-12 | Method of inspecting thin film capacitor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7297979A JPS55166053A (en) | 1979-06-12 | 1979-06-12 | Method of inspecting thin film capacitor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55166053A true JPS55166053A (en) | 1980-12-24 |
Family
ID=13505007
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7297979A Pending JPS55166053A (en) | 1979-06-12 | 1979-06-12 | Method of inspecting thin film capacitor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55166053A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57144473A (en) * | 1981-03-02 | 1982-09-07 | Ckd Corp | Discriminating method of leakage current characteristic of capacitor |
-
1979
- 1979-06-12 JP JP7297979A patent/JPS55166053A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57144473A (en) * | 1981-03-02 | 1982-09-07 | Ckd Corp | Discriminating method of leakage current characteristic of capacitor |
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