JPS55162073A - Apparatus for measuring voltage* current and temperature in thyristor - Google Patents
Apparatus for measuring voltage* current and temperature in thyristorInfo
- Publication number
- JPS55162073A JPS55162073A JP7212880A JP7212880A JPS55162073A JP S55162073 A JPS55162073 A JP S55162073A JP 7212880 A JP7212880 A JP 7212880A JP 7212880 A JP7212880 A JP 7212880A JP S55162073 A JPS55162073 A JP S55162073A
- Authority
- JP
- Japan
- Prior art keywords
- thyristor
- current
- temperature
- measuring voltage
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
- G01K1/024—Means for indicating or recording specially adapted for thermometers for remote indication
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/12—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/263—Circuits therefor for testing thyristors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Radiation Pyrometers (AREA)
- Power Conversion In General (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE7904751A SE7904751L (en) | 1979-05-31 | 1979-05-31 | DEVICE FOR Saturation of current, temperature and / or voltage in thyristors |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55162073A true JPS55162073A (en) | 1980-12-17 |
Family
ID=20338180
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7212880A Pending JPS55162073A (en) | 1979-05-31 | 1980-05-29 | Apparatus for measuring voltage* current and temperature in thyristor |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS55162073A (en) |
DE (1) | DE3019020A1 (en) |
FR (1) | FR2458076A1 (en) |
GB (1) | GB2052054A (en) |
SE (1) | SE7904751L (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019537009A (en) * | 2017-03-29 | 2019-12-19 | ミツビシ・エレクトリック・アールアンドディー・センター・ヨーロッパ・ビーヴィMitsubishi Electric R&D Centre Europe B.V. | Apparatus and method for monitoring power semiconductor die |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0218893A3 (en) * | 1985-09-11 | 1987-08-19 | BBC Brown Boveri AG | Process and device for remotely measuring and controlling the operational condition of a high-voltage apparatus |
GB2197066B (en) * | 1986-11-05 | 1990-11-21 | Plessey Co Plc | Improvements relating to bathythermographs |
CN102565662B (en) * | 2012-03-15 | 2014-08-27 | 株洲变流技术国家工程研究中心有限公司 | State detection device for high-potential thyristor |
CN104167437A (en) * | 2013-05-17 | 2014-11-26 | 国家电网公司 | Improved high-power thyristor |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1428645A (en) * | 1964-02-12 | 1966-02-18 | Philips Nv | Semiconductor device provided with a source of recombination radiation by controlled injection |
US3610938A (en) * | 1969-10-07 | 1971-10-05 | English Electric Co Ltd | Apparatus for monitoring operational parameters of high-voltage valves |
US3757174A (en) * | 1972-07-31 | 1973-09-04 | Sharp Kk | Light emitting four layer semiconductor |
US3877052A (en) * | 1973-12-26 | 1975-04-08 | Bell Telephone Labor Inc | Light-emitting semiconductor apparatus for optical fibers |
SE418997B (en) * | 1978-06-26 | 1981-07-06 | Asea Ab | FIBEROPTICAL TEMPERATURE SENSOR BASED ON THE MEASUREMENT OF THE TEMPERATURE-DEPENDENT SPECTRAL ABSORPTION FORM OF A MATERIAL |
-
1979
- 1979-05-31 SE SE7904751A patent/SE7904751L/en not_active Application Discontinuation
-
1980
- 1980-05-19 DE DE19803019020 patent/DE3019020A1/en not_active Withdrawn
- 1980-05-28 FR FR8011807A patent/FR2458076A1/en not_active Withdrawn
- 1980-05-29 JP JP7212880A patent/JPS55162073A/en active Pending
- 1980-05-30 GB GB8017708A patent/GB2052054A/en not_active Withdrawn
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019537009A (en) * | 2017-03-29 | 2019-12-19 | ミツビシ・エレクトリック・アールアンドディー・センター・ヨーロッパ・ビーヴィMitsubishi Electric R&D Centre Europe B.V. | Apparatus and method for monitoring power semiconductor die |
US11378612B2 (en) | 2017-03-29 | 2022-07-05 | Mitsubishi Electric Corporation | Device and method for monitoring the health of a power semiconductor die |
Also Published As
Publication number | Publication date |
---|---|
FR2458076A1 (en) | 1980-12-26 |
DE3019020A1 (en) | 1980-12-18 |
GB2052054A (en) | 1981-01-21 |
SE7904751L (en) | 1980-12-01 |
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