JPS55161306A - Partly plated porous sheet - Google Patents
Partly plated porous sheetInfo
- Publication number
- JPS55161306A JPS55161306A JP6941779A JP6941779A JPS55161306A JP S55161306 A JPS55161306 A JP S55161306A JP 6941779 A JP6941779 A JP 6941779A JP 6941779 A JP6941779 A JP 6941779A JP S55161306 A JPS55161306 A JP S55161306A
- Authority
- JP
- Japan
- Prior art keywords
- porous sheet
- plated porous
- partly plated
- partly
- sheet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Laminated Bodies (AREA)
- Chemically Coating (AREA)
- Electroplating Methods And Accessories (AREA)
- Non-Insulated Conductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6941779A JPS55161306A (en) | 1979-06-05 | 1979-06-05 | Partly plated porous sheet |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6941779A JPS55161306A (en) | 1979-06-05 | 1979-06-05 | Partly plated porous sheet |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55161306A true JPS55161306A (en) | 1980-12-15 |
Family
ID=13402004
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6941779A Pending JPS55161306A (en) | 1979-06-05 | 1979-06-05 | Partly plated porous sheet |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55161306A (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61196413U (en) * | 1985-05-29 | 1986-12-08 | ||
JPS6318711U (en) * | 1986-07-23 | 1988-02-06 | ||
JPS63205006A (en) * | 1987-02-20 | 1988-08-24 | 株式会社 潤工社 | Anisotropic conducting material |
US5262718A (en) * | 1985-08-05 | 1993-11-16 | Raychem Limited | Anisotropically electrically conductive article |
US5438223A (en) * | 1992-03-13 | 1995-08-01 | Nitto Denko Corporation | Anisotropic electrically conductive adhesive film and connection structure using the same |
US6465742B1 (en) | 1999-09-16 | 2002-10-15 | Kabushiki Kaisha Toshiba | Three dimensional structure and method of manufacturing the same |
US6709806B2 (en) | 2000-03-31 | 2004-03-23 | Kabushiki Kaisha Toshiba | Method of forming composite member |
US7312621B2 (en) | 2002-03-29 | 2007-12-25 | Kabushiki Kaisha Toshiba | Semiconductor test unit having low contact resistance with examined electronic products, semiconductor contact board, method for testing semiconductor device, semiconductor device, and method for manufacturing thereof |
US7414417B2 (en) | 2003-07-10 | 2008-08-19 | Kabushiki Kaisha Toshiba | Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts |
JP2017019054A (en) * | 2015-07-10 | 2017-01-26 | 株式会社ディスコ | Chuck table and manufacturing method of chuck table |
-
1979
- 1979-06-05 JP JP6941779A patent/JPS55161306A/en active Pending
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61196413U (en) * | 1985-05-29 | 1986-12-08 | ||
JPH0429444Y2 (en) * | 1985-05-29 | 1992-07-16 | ||
US5262718A (en) * | 1985-08-05 | 1993-11-16 | Raychem Limited | Anisotropically electrically conductive article |
JPS6318711U (en) * | 1986-07-23 | 1988-02-06 | ||
JPS63205006A (en) * | 1987-02-20 | 1988-08-24 | 株式会社 潤工社 | Anisotropic conducting material |
US5438223A (en) * | 1992-03-13 | 1995-08-01 | Nitto Denko Corporation | Anisotropic electrically conductive adhesive film and connection structure using the same |
US6465742B1 (en) | 1999-09-16 | 2002-10-15 | Kabushiki Kaisha Toshiba | Three dimensional structure and method of manufacturing the same |
US6709806B2 (en) | 2000-03-31 | 2004-03-23 | Kabushiki Kaisha Toshiba | Method of forming composite member |
US7312621B2 (en) | 2002-03-29 | 2007-12-25 | Kabushiki Kaisha Toshiba | Semiconductor test unit having low contact resistance with examined electronic products, semiconductor contact board, method for testing semiconductor device, semiconductor device, and method for manufacturing thereof |
US7414417B2 (en) | 2003-07-10 | 2008-08-19 | Kabushiki Kaisha Toshiba | Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts |
JP2017019054A (en) * | 2015-07-10 | 2017-01-26 | 株式会社ディスコ | Chuck table and manufacturing method of chuck table |
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