JPS55160439U - - Google Patents
Info
- Publication number
- JPS55160439U JPS55160439U JP5885279U JP5885279U JPS55160439U JP S55160439 U JPS55160439 U JP S55160439U JP 5885279 U JP5885279 U JP 5885279U JP 5885279 U JP5885279 U JP 5885279U JP S55160439 U JPS55160439 U JP S55160439U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Finishing Walls (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5885279U JPS55160439U (enExample) | 1979-05-04 | 1979-05-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5885279U JPS55160439U (enExample) | 1979-05-04 | 1979-05-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS55160439U true JPS55160439U (enExample) | 1980-11-18 |
Family
ID=29292874
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5885279U Pending JPS55160439U (enExample) | 1979-05-04 | 1979-05-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55160439U (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5815701U (ja) * | 1981-07-22 | 1983-01-31 | 新日軽株式会社 | 屋根置式バルコニ− |
| JP2008501875A (ja) * | 2004-06-04 | 2008-01-24 | ビーエーエー リミテッド | クラッディング |
| US8759119B2 (en) | 1999-11-11 | 2014-06-24 | Fujitsu Semiconductor Limited | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state |
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1979
- 1979-05-04 JP JP5885279U patent/JPS55160439U/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5815701U (ja) * | 1981-07-22 | 1983-01-31 | 新日軽株式会社 | 屋根置式バルコニ− |
| US8759119B2 (en) | 1999-11-11 | 2014-06-24 | Fujitsu Semiconductor Limited | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state |
| JP2008501875A (ja) * | 2004-06-04 | 2008-01-24 | ビーエーエー リミテッド | クラッディング |
| US7966783B2 (en) | 2004-06-04 | 2011-06-28 | Baa (Ip Holdco) Limited | Cladding |