JPS55150120A - Automatic lapping unit for thin-film magnetic head - Google Patents
Automatic lapping unit for thin-film magnetic headInfo
- Publication number
- JPS55150120A JPS55150120A JP5547979A JP5547979A JPS55150120A JP S55150120 A JPS55150120 A JP S55150120A JP 5547979 A JP5547979 A JP 5547979A JP 5547979 A JP5547979 A JP 5547979A JP S55150120 A JPS55150120 A JP S55150120A
- Authority
- JP
- Japan
- Prior art keywords
- register
- value
- resistance
- coefficient
- resistance value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/31—Structure or manufacture of heads, e.g. inductive using thin films
- G11B5/3163—Fabrication methods or processes specially adapted for a particular head structure, e.g. using base layers for electroplating, using functional layers for masking, using energy or particle beams for shaping the structure or modifying the properties of the basic layers
- G11B5/3166—Testing or indicating in relation thereto, e.g. before the fabrication is completed
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Magnetic Heads (AREA)
Abstract
PURPOSE:To exercise forecast control over lapping work easily and rapidly with needed work precision by using a digital arithmetic and memory circuit to calculate a coefficient, determining how much each rod should be lapped, and a resistance- value measurement result. CONSTITUTION:Coefficients which determine how much substrate rods should correspondingly be lapped are set in coefficient register 12. Before lapping work, the resistance value of a thin-film resistor is measured and the obtained value is converted by A/D converter 9 into a digital value, which is stored in register 12 as an initial resistance value. Next, the intial resistance value in register 12 is multiplied by a coefficient in coefficient register 13 by a multiplier in 14 and the product is stored in a result register in the same 14. In response to an operation start command from start indicator 10, switch 11 is changed from the register 12 side over to the resistance-value transmission line side and the resistance value is inputted to comparator 16, which compares it to the value of register 14 to output a forecast control command to lapping mechanism part 18. Consequently, a resistance measure ment error can be lessened and the work precision can easily be improved.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5547979A JPS55150120A (en) | 1979-05-07 | 1979-05-07 | Automatic lapping unit for thin-film magnetic head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5547979A JPS55150120A (en) | 1979-05-07 | 1979-05-07 | Automatic lapping unit for thin-film magnetic head |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55150120A true JPS55150120A (en) | 1980-11-21 |
Family
ID=12999743
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5547979A Pending JPS55150120A (en) | 1979-05-07 | 1979-05-07 | Automatic lapping unit for thin-film magnetic head |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55150120A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0504831A2 (en) * | 1991-03-22 | 1992-09-23 | Read-Rite Corporation | Throat height control during lapping of magnetic heads |
US6217425B1 (en) | 1998-06-12 | 2001-04-17 | Tdk Corporation | Apparatus and method for lapping magnetic heads |
US6565414B2 (en) | 1999-10-25 | 2003-05-20 | Tdk Corporation | Polishing apparatus for magnetic head and method therefor |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4974519A (en) * | 1972-10-11 | 1974-07-18 |
-
1979
- 1979-05-07 JP JP5547979A patent/JPS55150120A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4974519A (en) * | 1972-10-11 | 1974-07-18 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0504831A2 (en) * | 1991-03-22 | 1992-09-23 | Read-Rite Corporation | Throat height control during lapping of magnetic heads |
US6217425B1 (en) | 1998-06-12 | 2001-04-17 | Tdk Corporation | Apparatus and method for lapping magnetic heads |
US6565414B2 (en) | 1999-10-25 | 2003-05-20 | Tdk Corporation | Polishing apparatus for magnetic head and method therefor |
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