JPS55147339A - Method of measuring length of crack - Google Patents

Method of measuring length of crack

Info

Publication number
JPS55147339A
JPS55147339A JP5672279A JP5672279A JPS55147339A JP S55147339 A JPS55147339 A JP S55147339A JP 5672279 A JP5672279 A JP 5672279A JP 5672279 A JP5672279 A JP 5672279A JP S55147339 A JPS55147339 A JP S55147339A
Authority
JP
Japan
Prior art keywords
cracks
shaft
isothermal line
length
rotation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5672279A
Other languages
Japanese (ja)
Inventor
Akio Inoue
Yoshio Furuishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5672279A priority Critical patent/JPS55147339A/en
Publication of JPS55147339A publication Critical patent/JPS55147339A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

PURPOSE: To measure the length of cracks without stopping the rotation of a rotary shaft by obtaining the temperature distribution of the rotary shaft after imparting heat to the rotary shaft where a crack occurs.
CONSTITUTION: When a point in the vicinity of cracks of a shaft during its rotation is heated for a short period of time by means of a high-frequency heating device 4, the heat is transmitted concentrically within the shaft from a starting point of a heat source point 5. If there are no cracks, the isothermal line on the shaft surface is substantially concentric, and if cracks are present, the isothermal line abruptly gets out of the concentric circle shape at this portion. Therefore, by observing the presence or absence of the distortion in the isothermal line on the shaft surface, the length of the cracks can be obtained. Moreover, since a synchronous temperature measuring apparatus 6 performs the observation of the isothermal line in synchronism with the rotation of the shaft, an isothermal line pattern 7 is taken in a picture in a predetermined short period of time after the heating, and the picture is served for the measurement of the length of cracks.
COPYRIGHT: (C)1980,JPO&Japio
JP5672279A 1979-05-04 1979-05-04 Method of measuring length of crack Pending JPS55147339A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5672279A JPS55147339A (en) 1979-05-04 1979-05-04 Method of measuring length of crack

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5672279A JPS55147339A (en) 1979-05-04 1979-05-04 Method of measuring length of crack

Publications (1)

Publication Number Publication Date
JPS55147339A true JPS55147339A (en) 1980-11-17

Family

ID=13035373

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5672279A Pending JPS55147339A (en) 1979-05-04 1979-05-04 Method of measuring length of crack

Country Status (1)

Country Link
JP (1) JPS55147339A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63110145U (en) * 1987-01-10 1988-07-15
JPH03197856A (en) * 1989-12-26 1991-08-29 Toshiba Corp Inspecting device for surface layer defect

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63110145U (en) * 1987-01-10 1988-07-15
JPH0533417Y2 (en) * 1987-01-10 1993-08-25
JPH03197856A (en) * 1989-12-26 1991-08-29 Toshiba Corp Inspecting device for surface layer defect

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