JPS55127280U - - Google Patents
Info
- Publication number
- JPS55127280U JPS55127280U JP2824179U JP2824179U JPS55127280U JP S55127280 U JPS55127280 U JP S55127280U JP 2824179 U JP2824179 U JP 2824179U JP 2824179 U JP2824179 U JP 2824179U JP S55127280 U JPS55127280 U JP S55127280U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2824179U JPS6139974Y2 (enExample) | 1979-03-05 | 1979-03-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2824179U JPS6139974Y2 (enExample) | 1979-03-05 | 1979-03-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55127280U true JPS55127280U (enExample) | 1980-09-09 |
| JPS6139974Y2 JPS6139974Y2 (enExample) | 1986-11-15 |
Family
ID=28873841
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2824179U Expired JPS6139974Y2 (enExample) | 1979-03-05 | 1979-03-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6139974Y2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4211326B2 (ja) * | 2002-08-28 | 2009-01-21 | ヤマハ株式会社 | 半導体検査方法及び装置 |
-
1979
- 1979-03-05 JP JP2824179U patent/JPS6139974Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6139974Y2 (enExample) | 1986-11-15 |