JPS5496394A - Disconnection checking method for pattern electrode plate - Google Patents

Disconnection checking method for pattern electrode plate

Info

Publication number
JPS5496394A
JPS5496394A JP15377677A JP15377677A JPS5496394A JP S5496394 A JPS5496394 A JP S5496394A JP 15377677 A JP15377677 A JP 15377677A JP 15377677 A JP15377677 A JP 15377677A JP S5496394 A JPS5496394 A JP S5496394A
Authority
JP
Japan
Prior art keywords
disconnection
electrode
electrode plate
pattern electrode
lighting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15377677A
Other languages
Japanese (ja)
Inventor
Yasuro Inoue
Akira Ishizu
Satoru Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP15377677A priority Critical patent/JPS5496394A/en
Publication of JPS5496394A publication Critical patent/JPS5496394A/en
Pending legal-status Critical Current

Links

Landscapes

  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

PURPOSE: To enhance the checking efficiency by securing the decision for the disconnection state of the pattern electrode plate by the light emitting state of the field effect material such as the liquid crystal.
CONSTITUTION: Checked pattern electrode plate 1 provided on metal electrode 12, and a constant field is applied between electrode 12 and back electrode 9 via power source 13. Thus, liquid crystal 8 of the field effect type lights up as long as no disconnection takes place between the segments of plate 1. If the disconnection takes place there, no voltage is applied crystal 8 located between segment J and electrode 9 with no lighting there. Thus, the disconnection can be detected by lighting or no lighting, enhancing the checking efficiency.
COPYRIGHT: (C)1979,JPO&Japio
JP15377677A 1977-12-20 1977-12-20 Disconnection checking method for pattern electrode plate Pending JPS5496394A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15377677A JPS5496394A (en) 1977-12-20 1977-12-20 Disconnection checking method for pattern electrode plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15377677A JPS5496394A (en) 1977-12-20 1977-12-20 Disconnection checking method for pattern electrode plate

Publications (1)

Publication Number Publication Date
JPS5496394A true JPS5496394A (en) 1979-07-30

Family

ID=15569881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15377677A Pending JPS5496394A (en) 1977-12-20 1977-12-20 Disconnection checking method for pattern electrode plate

Country Status (1)

Country Link
JP (1) JPS5496394A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04319909A (en) * 1991-04-19 1992-11-10 Sharp Corp Device and method of inspection active matrix board
US10984746B2 (en) 2018-12-27 2021-04-20 Seiko Epson Corporation Liquid crystal driver, electronic apparatus, and mobile body
US11126023B2 (en) 2018-12-27 2021-09-21 Seiko Epson Corporation Liquid crystal device, electronic apparatus, and mobile body
US11189203B2 (en) 2019-01-28 2021-11-30 Seiko Epson Corporation Liquid crystal device, liquid crystal driver, electronic apparatus, and mobile body

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04319909A (en) * 1991-04-19 1992-11-10 Sharp Corp Device and method of inspection active matrix board
US10984746B2 (en) 2018-12-27 2021-04-20 Seiko Epson Corporation Liquid crystal driver, electronic apparatus, and mobile body
US11126023B2 (en) 2018-12-27 2021-09-21 Seiko Epson Corporation Liquid crystal device, electronic apparatus, and mobile body
US11536994B2 (en) 2018-12-27 2022-12-27 Seiko Epson Corporation Liquid crystal device, electronic apparatus, and mobile body
US11189203B2 (en) 2019-01-28 2021-11-30 Seiko Epson Corporation Liquid crystal device, liquid crystal driver, electronic apparatus, and mobile body

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