JPS5487069U - - Google Patents
Info
- Publication number
- JPS5487069U JPS5487069U JP16192777U JP16192777U JPS5487069U JP S5487069 U JPS5487069 U JP S5487069U JP 16192777 U JP16192777 U JP 16192777U JP 16192777 U JP16192777 U JP 16192777U JP S5487069 U JPS5487069 U JP S5487069U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16192777U JPS5487069U (en) | 1977-12-02 | 1977-12-02 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16192777U JPS5487069U (en) | 1977-12-02 | 1977-12-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5487069U true JPS5487069U (en) | 1979-06-20 |
Family
ID=29157142
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16192777U Pending JPS5487069U (en) | 1977-12-02 | 1977-12-02 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5487069U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58102536A (en) * | 1981-12-14 | 1983-06-18 | Fujitsu Ltd | Semiconductor crystal evaluation method |
-
1977
- 1977-12-02 JP JP16192777U patent/JPS5487069U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58102536A (en) * | 1981-12-14 | 1983-06-18 | Fujitsu Ltd | Semiconductor crystal evaluation method |