JPS547586B2 - - Google Patents

Info

Publication number
JPS547586B2
JPS547586B2 JP10948875A JP10948875A JPS547586B2 JP S547586 B2 JPS547586 B2 JP S547586B2 JP 10948875 A JP10948875 A JP 10948875A JP 10948875 A JP10948875 A JP 10948875A JP S547586 B2 JPS547586 B2 JP S547586B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10948875A
Other languages
Japanese (ja)
Other versions
JPS5233782A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP50109488A priority Critical patent/JPS5233782A/ja
Publication of JPS5233782A publication Critical patent/JPS5233782A/ja
Publication of JPS547586B2 publication Critical patent/JPS547586B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP50109488A 1975-09-11 1975-09-11 Single crystal x-ray diffraction device Granted JPS5233782A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50109488A JPS5233782A (en) 1975-09-11 1975-09-11 Single crystal x-ray diffraction device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50109488A JPS5233782A (en) 1975-09-11 1975-09-11 Single crystal x-ray diffraction device

Publications (2)

Publication Number Publication Date
JPS5233782A JPS5233782A (en) 1977-03-15
JPS547586B2 true JPS547586B2 (OSRAM) 1979-04-07

Family

ID=14511506

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50109488A Granted JPS5233782A (en) 1975-09-11 1975-09-11 Single crystal x-ray diffraction device

Country Status (1)

Country Link
JP (1) JPS5233782A (OSRAM)

Also Published As

Publication number Publication date
JPS5233782A (en) 1977-03-15

Similar Documents

Publication Publication Date Title
BG21685A1 (OSRAM)
BG22103A1 (OSRAM)
BG22192A1 (OSRAM)
BG22224A1 (OSRAM)
BG22319A1 (OSRAM)
BG22478A1 (OSRAM)
BG22489A1 (OSRAM)
BG22500A1 (OSRAM)
BG22715A1 (OSRAM)
BG22744A1 (OSRAM)
BG23133A1 (OSRAM)
CH1422975A4 (OSRAM)
CH1568375A4 (OSRAM)
CH578098A5 (OSRAM)
CH583350A5 (OSRAM)
CH585374A5 (OSRAM)
CH587513B5 (OSRAM)
CH588811A5 (OSRAM)
CH588848A5 (OSRAM)
CH590628A5 (OSRAM)
CH591693A5 (OSRAM)
CH593070A5 (OSRAM)
CH594469A5 (OSRAM)
CH595055A5 (OSRAM)
CH595419A5 (OSRAM)