JPS5473690A - Method and apparatus for measuring linearity of photo detectors - Google Patents

Method and apparatus for measuring linearity of photo detectors

Info

Publication number
JPS5473690A
JPS5473690A JP14070877A JP14070877A JPS5473690A JP S5473690 A JPS5473690 A JP S5473690A JP 14070877 A JP14070877 A JP 14070877A JP 14070877 A JP14070877 A JP 14070877A JP S5473690 A JPS5473690 A JP S5473690A
Authority
JP
Japan
Prior art keywords
base
refractive index
turning
light
reflected light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14070877A
Other languages
English (en)
Other versions
JPS5925446B2 (ja
Inventor
Motoi Nanjo
Yoshimi Kadoi
Hiroshi Nakano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP14070877A priority Critical patent/JPS5925446B2/ja
Publication of JPS5473690A publication Critical patent/JPS5473690A/ja
Publication of JPS5925446B2 publication Critical patent/JPS5925446B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
JP14070877A 1977-11-25 1977-11-25 受光素子の直線性を測定する方法および装置 Expired JPS5925446B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14070877A JPS5925446B2 (ja) 1977-11-25 1977-11-25 受光素子の直線性を測定する方法および装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14070877A JPS5925446B2 (ja) 1977-11-25 1977-11-25 受光素子の直線性を測定する方法および装置

Publications (2)

Publication Number Publication Date
JPS5473690A true JPS5473690A (en) 1979-06-13
JPS5925446B2 JPS5925446B2 (ja) 1984-06-18

Family

ID=15274866

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14070877A Expired JPS5925446B2 (ja) 1977-11-25 1977-11-25 受光素子の直線性を測定する方法および装置

Country Status (1)

Country Link
JP (1) JPS5925446B2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1645854A1 (en) * 2004-09-21 2006-04-12 Itt Manufacturing Enterprises, Inc. Method and apparatus for measurement of optical detector linearity

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114323567A (zh) * 2021-12-31 2022-04-12 深圳市聚飞光电股份有限公司 一种光电探测器测试装置及测试方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1645854A1 (en) * 2004-09-21 2006-04-12 Itt Manufacturing Enterprises, Inc. Method and apparatus for measurement of optical detector linearity
US7095007B2 (en) 2004-09-21 2006-08-22 Itt Manufacturing Enterprises, Inc. Method and apparatus for measurement of optical detector linearity

Also Published As

Publication number Publication date
JPS5925446B2 (ja) 1984-06-18

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