JPS5445087Y2 - - Google Patents

Info

Publication number
JPS5445087Y2
JPS5445087Y2 JP1975007987U JP798775U JPS5445087Y2 JP S5445087 Y2 JPS5445087 Y2 JP S5445087Y2 JP 1975007987 U JP1975007987 U JP 1975007987U JP 798775 U JP798775 U JP 798775U JP S5445087 Y2 JPS5445087 Y2 JP S5445087Y2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1975007987U
Other versions
JPS50100584U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS50100584U publication Critical patent/JPS50100584U/ja
Application granted granted Critical
Publication of JPS5445087Y2 publication Critical patent/JPS5445087Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/10Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/34Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
    • G01J1/36Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/37Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using pneumatic detection

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
  • Spectrometry And Color Measurement (AREA)
JP1975007987U 1974-01-16 1975-01-16 Expired JPS5445087Y2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE7401319 1974-01-16

Publications (2)

Publication Number Publication Date
JPS50100584U JPS50100584U (ja) 1975-08-20
JPS5445087Y2 true JPS5445087Y2 (ja) 1979-12-24

Family

ID=6643327

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1975007987U Expired JPS5445087Y2 (ja) 1974-01-16 1975-01-16

Country Status (5)

Country Link
US (1) US3932041A (ja)
JP (1) JPS5445087Y2 (ja)
FR (1) FR2257899B1 (ja)
GB (1) GB1476535A (ja)
IT (1) IT1025329B (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4467213A (en) * 1982-06-28 1984-08-21 Beckman Instruments, Inc. Source assembly for gas analysis instruments

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2227147A (en) * 1938-03-24 1940-12-31 American District Telegraph Co Photoelectric burglar alarm system
FR1389955A (fr) * 1964-04-09 1965-02-19 Hartmann & Braun Ag Photomètre à diffusion
CH514838A (de) * 1970-04-17 1971-10-31 Jaeger Erich Gerät zur Gasanalyse
DE2065118A1 (de) * 1970-10-27 1972-07-20 Siemens Ag Lichtzerhacker für ein nach dem Zweistrahlprinzip arbeitendes Ultrarot-Gasanalysegerät. Ausscheidung aus: 2052609
JPS516142Y2 (ja) * 1971-04-16 1976-02-19

Also Published As

Publication number Publication date
FR2257899B1 (ja) 1976-12-31
GB1476535A (en) 1977-06-16
US3932041A (en) 1976-01-13
JPS50100584U (ja) 1975-08-20
IT1025329B (it) 1978-08-10
FR2257899A1 (ja) 1975-08-08

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