JPS5445066U - - Google Patents

Info

Publication number
JPS5445066U
JPS5445066U JP11888677U JP11888677U JPS5445066U JP S5445066 U JPS5445066 U JP S5445066U JP 11888677 U JP11888677 U JP 11888677U JP 11888677 U JP11888677 U JP 11888677U JP S5445066 U JPS5445066 U JP S5445066U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11888677U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11888677U priority Critical patent/JPS5445066U/ja
Publication of JPS5445066U publication Critical patent/JPS5445066U/ja
Pending legal-status Critical Current

Links

JP11888677U 1977-09-03 1977-09-03 Pending JPS5445066U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11888677U JPS5445066U (en) 1977-09-03 1977-09-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11888677U JPS5445066U (en) 1977-09-03 1977-09-03

Publications (1)

Publication Number Publication Date
JPS5445066U true JPS5445066U (en) 1979-03-28

Family

ID=29073653

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11888677U Pending JPS5445066U (en) 1977-09-03 1977-09-03

Country Status (1)

Country Link
JP (1) JPS5445066U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58109832A (en) * 1981-12-23 1983-06-30 Hoxan Corp Tensile testing device at low temperature
JPS58186031A (en) * 1982-04-07 1983-10-29 ユナイテツド・テクノロジ−ズ・コ−ポレイシヨン Method and device of low-temperature guarantee test of rotatable metallic part
JPS6250639A (en) * 1985-08-29 1987-03-05 Shimadzu Corp Tension testing machine for test-piece under high temperature and low temperature

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49128443A (en) * 1973-04-19 1974-12-09
JPS5226695U (en) * 1975-08-12 1977-02-24

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49128443A (en) * 1973-04-19 1974-12-09
JPS5226695U (en) * 1975-08-12 1977-02-24

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58109832A (en) * 1981-12-23 1983-06-30 Hoxan Corp Tensile testing device at low temperature
JPH0211854B2 (en) * 1981-12-23 1990-03-16 Hokusan Kk
JPS58186031A (en) * 1982-04-07 1983-10-29 ユナイテツド・テクノロジ−ズ・コ−ポレイシヨン Method and device of low-temperature guarantee test of rotatable metallic part
JPH0230657B2 (en) * 1982-04-07 1990-07-09 Yunaitetsudo Tekunorojiizu Corp
JPS6250639A (en) * 1985-08-29 1987-03-05 Shimadzu Corp Tension testing machine for test-piece under high temperature and low temperature
JPH0735992B2 (en) * 1985-08-29 1995-04-19 株式会社島津製作所 High / low temperature tensile tester

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