JPS5439701B2 - - Google Patents

Info

Publication number
JPS5439701B2
JPS5439701B2 JP15757076A JP15757076A JPS5439701B2 JP S5439701 B2 JPS5439701 B2 JP S5439701B2 JP 15757076 A JP15757076 A JP 15757076A JP 15757076 A JP15757076 A JP 15757076A JP S5439701 B2 JPS5439701 B2 JP S5439701B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15757076A
Other languages
Japanese (ja)
Other versions
JPS5382237A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15757076A priority Critical patent/JPS5382237A/ja
Publication of JPS5382237A publication Critical patent/JPS5382237A/ja
Publication of JPS5439701B2 publication Critical patent/JPS5439701B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Static Random-Access Memory (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP15757076A 1976-12-28 1976-12-28 Test pattern of semiconductor circuit Granted JPS5382237A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15757076A JPS5382237A (en) 1976-12-28 1976-12-28 Test pattern of semiconductor circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15757076A JPS5382237A (en) 1976-12-28 1976-12-28 Test pattern of semiconductor circuit

Publications (2)

Publication Number Publication Date
JPS5382237A JPS5382237A (en) 1978-07-20
JPS5439701B2 true JPS5439701B2 (fr) 1979-11-29

Family

ID=15652566

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15757076A Granted JPS5382237A (en) 1976-12-28 1976-12-28 Test pattern of semiconductor circuit

Country Status (1)

Country Link
JP (1) JPS5382237A (fr)

Also Published As

Publication number Publication date
JPS5382237A (en) 1978-07-20

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