JPS5438712A - Leased circuit meeting test equipment - Google Patents

Leased circuit meeting test equipment

Info

Publication number
JPS5438712A
JPS5438712A JP10419977A JP10419977A JPS5438712A JP S5438712 A JPS5438712 A JP S5438712A JP 10419977 A JP10419977 A JP 10419977A JP 10419977 A JP10419977 A JP 10419977A JP S5438712 A JPS5438712 A JP S5438712A
Authority
JP
Japan
Prior art keywords
test equipment
meeting test
circuit meeting
leased circuit
leased
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10419977A
Other languages
Japanese (ja)
Other versions
JPS581864B2 (en
Inventor
Shuichi Takahashi
Seigo Ishiyama
Ryoji Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP10419977A priority Critical patent/JPS581864B2/en
Publication of JPS5438712A publication Critical patent/JPS5438712A/en
Publication of JPS581864B2 publication Critical patent/JPS581864B2/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing

Abstract

PURPOSE:To simplify the meeting test with enhanced efficiency for the test of leased circuits of various standards, by providing two pairs of plugs to be connected to 2W-circuit, the avometer and the speaker circuit.
JP10419977A 1977-09-01 1977-09-01 Dedicated line connection test equipment Expired JPS581864B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10419977A JPS581864B2 (en) 1977-09-01 1977-09-01 Dedicated line connection test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10419977A JPS581864B2 (en) 1977-09-01 1977-09-01 Dedicated line connection test equipment

Publications (2)

Publication Number Publication Date
JPS5438712A true JPS5438712A (en) 1979-03-23
JPS581864B2 JPS581864B2 (en) 1983-01-13

Family

ID=14374293

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10419977A Expired JPS581864B2 (en) 1977-09-01 1977-09-01 Dedicated line connection test equipment

Country Status (1)

Country Link
JP (1) JPS581864B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63253105A (en) * 1987-04-08 1988-10-20 Hitachi Ltd Compound generating plant
JPH0392852U (en) * 1990-01-05 1991-09-20
JPH07143527A (en) * 1993-11-19 1995-06-02 Nec Corp Spring jack for monitor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63253105A (en) * 1987-04-08 1988-10-20 Hitachi Ltd Compound generating plant
JPH0392852U (en) * 1990-01-05 1991-09-20
JPH07143527A (en) * 1993-11-19 1995-06-02 Nec Corp Spring jack for monitor

Also Published As

Publication number Publication date
JPS581864B2 (en) 1983-01-13

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