JPS54375B2 - - Google Patents
Info
- Publication number
- JPS54375B2 JPS54375B2 JP846575A JP846575A JPS54375B2 JP S54375 B2 JPS54375 B2 JP S54375B2 JP 846575 A JP846575 A JP 846575A JP 846575 A JP846575 A JP 846575A JP S54375 B2 JPS54375 B2 JP S54375B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP846575A JPS5183476A (ja) | 1975-01-20 | 1975-01-20 | Moredenryusokuteisochi |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP846575A JPS5183476A (ja) | 1975-01-20 | 1975-01-20 | Moredenryusokuteisochi |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5183476A JPS5183476A (ja) | 1976-07-22 |
| JPS54375B2 true JPS54375B2 (cs) | 1979-01-10 |
Family
ID=11693870
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP846575A Granted JPS5183476A (ja) | 1975-01-20 | 1975-01-20 | Moredenryusokuteisochi |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5183476A (cs) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019244465A1 (ja) * | 2018-06-21 | 2019-12-26 | 三菱電機株式会社 | 半導体素子の信頼性評価装置および半導体素子の信頼性評価方法 |
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1975
- 1975-01-20 JP JP846575A patent/JPS5183476A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5183476A (ja) | 1976-07-22 |