JPS5435299B2 - - Google Patents
Info
- Publication number
- JPS5435299B2 JPS5435299B2 JP5658574A JP5658574A JPS5435299B2 JP S5435299 B2 JPS5435299 B2 JP S5435299B2 JP 5658574 A JP5658574 A JP 5658574A JP 5658574 A JP5658574 A JP 5658574A JP S5435299 B2 JPS5435299 B2 JP S5435299B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5658574A JPS5435299B2 (en:Method) | 1974-05-22 | 1974-05-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5658574A JPS5435299B2 (en:Method) | 1974-05-22 | 1974-05-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50149975A JPS50149975A (en:Method) | 1975-12-01 |
| JPS5435299B2 true JPS5435299B2 (en:Method) | 1979-11-01 |
Family
ID=13031241
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5658574A Expired JPS5435299B2 (en:Method) | 1974-05-22 | 1974-05-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5435299B2 (en:Method) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59228174A (ja) * | 1983-06-09 | 1984-12-21 | Ibiden Co Ltd | プリント配線板検査用治具回路板 |
| JPH0395979A (ja) * | 1989-09-07 | 1991-04-22 | Agency Of Ind Science & Technol | 超伝導集積回路の良否の診断方法 |
-
1974
- 1974-05-22 JP JP5658574A patent/JPS5435299B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS50149975A (en:Method) | 1975-12-01 |