JPS543348B2 - - Google Patents
Info
- Publication number
- JPS543348B2 JPS543348B2 JP12286476A JP12286476A JPS543348B2 JP S543348 B2 JPS543348 B2 JP S543348B2 JP 12286476 A JP12286476 A JP 12286476A JP 12286476 A JP12286476 A JP 12286476A JP S543348 B2 JPS543348 B2 JP S543348B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Thyristors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12286476A JPS5348479A (en) | 1976-10-15 | 1976-10-15 | Dv/dt rating measuring circuit of thyristor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12286476A JPS5348479A (en) | 1976-10-15 | 1976-10-15 | Dv/dt rating measuring circuit of thyristor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5348479A JPS5348479A (en) | 1978-05-01 |
JPS543348B2 true JPS543348B2 (es) | 1979-02-21 |
Family
ID=14846514
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12286476A Granted JPS5348479A (en) | 1976-10-15 | 1976-10-15 | Dv/dt rating measuring circuit of thyristor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5348479A (es) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0664120B2 (ja) * | 1984-12-26 | 1994-08-22 | 株式会社日立製作所 | サイリスタのdv/dt耐量測定方法 |
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1976
- 1976-10-15 JP JP12286476A patent/JPS5348479A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5348479A (en) | 1978-05-01 |