JPS5424314B2 - - Google Patents
Info
- Publication number
- JPS5424314B2 JPS5424314B2 JP15393475A JP15393475A JPS5424314B2 JP S5424314 B2 JPS5424314 B2 JP S5424314B2 JP 15393475 A JP15393475 A JP 15393475A JP 15393475 A JP15393475 A JP 15393475A JP S5424314 B2 JPS5424314 B2 JP S5424314B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50153934A JPS5278488A (en) | 1975-12-25 | 1975-12-25 | Xxray flaw detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50153934A JPS5278488A (en) | 1975-12-25 | 1975-12-25 | Xxray flaw detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5278488A JPS5278488A (en) | 1977-07-01 |
| JPS5424314B2 true JPS5424314B2 (en) | 1979-08-20 |
Family
ID=15573261
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50153934A Granted JPS5278488A (en) | 1975-12-25 | 1975-12-25 | Xxray flaw detector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5278488A (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4968789A (en) * | 1972-09-01 | 1974-07-03 |
-
1975
- 1975-12-25 JP JP50153934A patent/JPS5278488A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4968789A (en) * | 1972-09-01 | 1974-07-03 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5278488A (en) | 1977-07-01 |