JPS54178532U - - Google Patents
Info
- Publication number
- JPS54178532U JPS54178532U JP7614878U JP7614878U JPS54178532U JP S54178532 U JPS54178532 U JP S54178532U JP 7614878 U JP7614878 U JP 7614878U JP 7614878 U JP7614878 U JP 7614878U JP S54178532 U JPS54178532 U JP S54178532U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Optical Elements Other Than Lenses (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7614878U JPS54178532U (fr) | 1978-06-06 | 1978-06-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7614878U JPS54178532U (fr) | 1978-06-06 | 1978-06-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54178532U true JPS54178532U (fr) | 1979-12-17 |
Family
ID=28991166
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7614878U Pending JPS54178532U (fr) | 1978-06-06 | 1978-06-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54178532U (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20150128721A (ko) * | 2013-03-07 | 2015-11-18 | 헬무트 휘셔 게엠베하 인스티투트 휘어 엘렉트로닉 운트 메쓰테크닉 | 광학 미러, 엑스선 형광 분석 장치 및 엑스선 형광 분석 방법 |
-
1978
- 1978-06-06 JP JP7614878U patent/JPS54178532U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20150128721A (ko) * | 2013-03-07 | 2015-11-18 | 헬무트 휘셔 게엠베하 인스티투트 휘어 엘렉트로닉 운트 메쓰테크닉 | 광학 미러, 엑스선 형광 분석 장치 및 엑스선 형광 분석 방법 |
| JP2016509231A (ja) * | 2013-03-07 | 2016-03-24 | ヘルムート・フィッシャー・ゲーエムベーハー・インスティテュート・フューア・エレクトロニク・ウント・メステクニク | 光学ミラー、ｘ線蛍光分析デバイス及びｘ線蛍光分析のための方法 |