JPS54157084A - Device for detecting position of dielectric portion on substrate - Google Patents

Device for detecting position of dielectric portion on substrate

Info

Publication number
JPS54157084A
JPS54157084A JP4553079A JP4553079A JPS54157084A JP S54157084 A JPS54157084 A JP S54157084A JP 4553079 A JP4553079 A JP 4553079A JP 4553079 A JP4553079 A JP 4553079A JP S54157084 A JPS54157084 A JP S54157084A
Authority
JP
Japan
Prior art keywords
substrate
dielectric portion
detecting position
dielectric
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4553079A
Other languages
English (en)
Other versions
JPS5538827B2 (ja
Inventor
Henrii Fuoa Ruisu
Baaton Hotsuji Fuiro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS54157084A publication Critical patent/JPS54157084A/ja
Publication of JPS5538827B2 publication Critical patent/JPS5538827B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
JP4553079A 1978-05-30 1979-04-16 Device for detecting position of dielectric portion on substrate Granted JPS54157084A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/910,253 US4227149A (en) 1978-05-30 1978-05-30 Sensing probe for determining location of conductive features

Publications (2)

Publication Number Publication Date
JPS54157084A true JPS54157084A (en) 1979-12-11
JPS5538827B2 JPS5538827B2 (ja) 1980-10-07

Family

ID=25428529

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4553079A Granted JPS54157084A (en) 1978-05-30 1979-04-16 Device for detecting position of dielectric portion on substrate

Country Status (4)

Country Link
US (1) US4227149A (ja)
EP (1) EP0005727B1 (ja)
JP (1) JPS54157084A (ja)
DE (1) DE2960084D1 (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2034122B (en) * 1978-10-02 1982-11-24 British Gas Corp Magnet assemblies for pipeline inspection vehicles
US4471298A (en) * 1981-12-11 1984-09-11 Cirdyne, Inc. Apparatus for automatically electrically testing printed circuit boards
US4646009A (en) * 1982-05-18 1987-02-24 Ade Corporation Contacts for conductivity-type sensors
US4810956A (en) * 1987-12-21 1989-03-07 Northern Telecom Limited Mounting bracket for test probes
US5257024A (en) * 1988-05-26 1993-10-26 Quan-Scan, Inc. Search position encoder
US5091693A (en) * 1990-07-13 1992-02-25 Schlumberger Technologies, Inc. Dual-sided test head having floating contact surfaces
FR2670298B1 (fr) * 1990-12-10 1993-03-05 Aerospatiale Systeme pour tester la continuite electrique et l'isolement des conducteurs electriques d'une piece de cablage.
US5597317A (en) * 1995-08-11 1997-01-28 W. L. Gore & Associates, Inc. Surface mating electrical connector
WO2002082528A1 (fr) * 2001-04-04 2002-10-17 Fujitsu Limited Appareil contacteur pour dispositif semi-conducteur et procede de test dudit dispositif semi-conducteur

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US806800A (en) * 1905-06-30 1905-12-12 Fleming E Greathouse Reel-carrier.
US2932015A (en) * 1956-12-26 1960-04-05 Kelsey Hayes Co Locating fixture and method
US3611128A (en) * 1968-07-26 1971-10-05 Hitachi Ltd Probe header for testing integrated circuits
US3676776A (en) * 1970-01-19 1972-07-11 Siemens Ag Testing probe construction
US3806801A (en) * 1972-12-26 1974-04-23 Ibm Probe contactor having buckling beam probes
DE2344239B2 (de) * 1973-09-01 1977-11-03 Luther, Erich, 3050 Wunstorf; Maelzer, Fritz; Maelzer, Martin; 7910 Reutti Post Neu-Ulm; Türkkan, Tamer, 3011 Laatzen Kontaktvorrichtung zum anschliessen einer gedruckten schaltung an ein pruefgeraet
US4019015A (en) * 1973-09-10 1977-04-19 International Business Machines Corporation Precision tool and workpiece positioning apparatus with ringout detection
US4063172A (en) * 1976-06-01 1977-12-13 International Business Machines Corporation Multiple site, differential displacement, surface contacting assembly
US4052793A (en) * 1976-10-04 1977-10-11 International Business Machines Corporation Method of obtaining proper probe alignment in a multiple contact environment
US4177425A (en) * 1977-09-06 1979-12-04 Seymour Lenz Multiple contact electrical test probe assembly

Also Published As

Publication number Publication date
DE2960084D1 (en) 1981-03-12
JPS5538827B2 (ja) 1980-10-07
EP0005727A1 (de) 1979-12-12
EP0005727B1 (de) 1981-01-21
US4227149A (en) 1980-10-07

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