JPS54156663A - Device for measuring thickness of hollow piece - Google Patents

Device for measuring thickness of hollow piece

Info

Publication number
JPS54156663A
JPS54156663A JP5625579A JP5625579A JPS54156663A JP S54156663 A JPS54156663 A JP S54156663A JP 5625579 A JP5625579 A JP 5625579A JP 5625579 A JP5625579 A JP 5625579A JP S54156663 A JPS54156663 A JP S54156663A
Authority
JP
Japan
Prior art keywords
measuring thickness
hollow piece
hollow
piece
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5625579A
Other languages
Japanese (ja)
Inventor
Deeru Buorufugangu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Vodafone GmbH
Original Assignee
Mannesmann AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mannesmann AG filed Critical Mannesmann AG
Publication of JPS54156663A publication Critical patent/JPS54156663A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP5625579A 1978-05-30 1979-05-08 Device for measuring thickness of hollow piece Pending JPS54156663A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2824051 1978-05-30

Publications (1)

Publication Number Publication Date
JPS54156663A true JPS54156663A (en) 1979-12-10

Family

ID=6040778

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5625579A Pending JPS54156663A (en) 1978-05-30 1979-05-08 Device for measuring thickness of hollow piece

Country Status (4)

Country Link
JP (1) JPS54156663A (en)
FR (1) FR2427580A1 (en)
GB (1) GB2027879A (en)
IT (1) IT1120196B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4491731A (en) * 1980-06-25 1985-01-01 Fuji Electric Co., Ltd. Tube wall thickness measurement
DE4204916A1 (en) * 1992-02-19 1993-08-26 Renolit Werke Gmbh METHOD AND DEVICE FOR QUALITY CONTROL OF FILM REELS MANUFACTURED ON CALENDAR OR EXTRUDER MACHINES

Also Published As

Publication number Publication date
IT7922891A0 (en) 1979-05-22
IT1120196B (en) 1986-03-19
FR2427580A1 (en) 1979-12-28
GB2027879A (en) 1980-02-27

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