JPS541435B2 - - Google Patents
Info
- Publication number
- JPS541435B2 JPS541435B2 JP3971975A JP3971975A JPS541435B2 JP S541435 B2 JPS541435 B2 JP S541435B2 JP 3971975 A JP3971975 A JP 3971975A JP 3971975 A JP3971975 A JP 3971975A JP S541435 B2 JPS541435 B2 JP S541435B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50039719A JPS51129180A (en) | 1975-04-01 | 1975-04-01 | Multiiprobe head for checking electric parameters of semiconductor device and microelectronic circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50039719A JPS51129180A (en) | 1975-04-01 | 1975-04-01 | Multiiprobe head for checking electric parameters of semiconductor device and microelectronic circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS51129180A JPS51129180A (en) | 1976-11-10 |
| JPS541435B2 true JPS541435B2 (ref) | 1979-01-24 |
Family
ID=12560781
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50039719A Granted JPS51129180A (en) | 1975-04-01 | 1975-04-01 | Multiiprobe head for checking electric parameters of semiconductor device and microelectronic circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS51129180A (ref) |
-
1975
- 1975-04-01 JP JP50039719A patent/JPS51129180A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS51129180A (en) | 1976-11-10 |