JPS5413888U - - Google Patents

Info

Publication number
JPS5413888U
JPS5413888U JP8707977U JP8707977U JPS5413888U JP S5413888 U JPS5413888 U JP S5413888U JP 8707977 U JP8707977 U JP 8707977U JP 8707977 U JP8707977 U JP 8707977U JP S5413888 U JPS5413888 U JP S5413888U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8707977U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8707977U priority Critical patent/JPS5413888U/ja
Publication of JPS5413888U publication Critical patent/JPS5413888U/ja
Pending legal-status Critical Current

Links

JP8707977U 1977-06-30 1977-06-30 Pending JPS5413888U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8707977U JPS5413888U (en) 1977-06-30 1977-06-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8707977U JPS5413888U (en) 1977-06-30 1977-06-30

Publications (1)

Publication Number Publication Date
JPS5413888U true JPS5413888U (en) 1979-01-29

Family

ID=29012265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8707977U Pending JPS5413888U (en) 1977-06-30 1977-06-30

Country Status (1)

Country Link
JP (1) JPS5413888U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6249269A (en) * 1985-08-19 1987-03-03 Fujitsu Ltd Test system
JPS62250379A (en) * 1986-04-23 1987-10-31 Nec Corp Testing method for semi-conductor device
JPH0213865A (en) * 1988-04-29 1990-01-18 Internatl Business Mach Corp <Ibm> Testable integrated circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6249269A (en) * 1985-08-19 1987-03-03 Fujitsu Ltd Test system
JPS62250379A (en) * 1986-04-23 1987-10-31 Nec Corp Testing method for semi-conductor device
JPH0213865A (en) * 1988-04-29 1990-01-18 Internatl Business Mach Corp <Ibm> Testable integrated circuit

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