JPS54138656U - - Google Patents
Info
- Publication number
- JPS54138656U JPS54138656U JP3562178U JP3562178U JPS54138656U JP S54138656 U JPS54138656 U JP S54138656U JP 3562178 U JP3562178 U JP 3562178U JP 3562178 U JP3562178 U JP 3562178U JP S54138656 U JPS54138656 U JP S54138656U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electroplating Methods And Accessories (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3562178U JPS54138656U (en) | 1978-03-20 | 1978-03-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3562178U JPS54138656U (en) | 1978-03-20 | 1978-03-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54138656U true JPS54138656U (en) | 1979-09-26 |
Family
ID=28895239
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3562178U Pending JPS54138656U (en) | 1978-03-20 | 1978-03-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54138656U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004198416A (en) * | 2002-12-18 | 2004-07-15 | Immobilien Ges Helmut Fischer Gmbh & Co Kg | Instrument for measuring thickness of thin layer |
| JP2008203245A (en) * | 2007-01-23 | 2008-09-04 | Sii Nanotechnology Inc | X-ray analysis apparatus and x-ray analysis method |
-
1978
- 1978-03-20 JP JP3562178U patent/JPS54138656U/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004198416A (en) * | 2002-12-18 | 2004-07-15 | Immobilien Ges Helmut Fischer Gmbh & Co Kg | Instrument for measuring thickness of thin layer |
| DE10259696B4 (en) | 2002-12-18 | 2018-07-05 | Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg | Device for measuring the thickness of thin layers |
| JP2008203245A (en) * | 2007-01-23 | 2008-09-04 | Sii Nanotechnology Inc | X-ray analysis apparatus and x-ray analysis method |