JPS54105588U - - Google Patents
Info
- Publication number
- JPS54105588U JPS54105588U JP141578U JP141578U JPS54105588U JP S54105588 U JPS54105588 U JP S54105588U JP 141578 U JP141578 U JP 141578U JP 141578 U JP141578 U JP 141578U JP S54105588 U JPS54105588 U JP S54105588U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP141578U JPS54105588U (en) | 1978-01-10 | 1978-01-10 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP141578U JPS54105588U (en) | 1978-01-10 | 1978-01-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54105588U true JPS54105588U (en) | 1979-07-25 |
Family
ID=28803544
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP141578U Pending JPS54105588U (en) | 1978-01-10 | 1978-01-10 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54105588U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010038914A (en) * | 2008-07-09 | 2010-02-18 | Toshiba Corp | Remote field eddy current flaw detecting probe |
JP2014178225A (en) * | 2013-03-15 | 2014-09-25 | Neturen Co Ltd | Hardened depth-measuring probe, and hardened depth-measuring method therewith |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5168287A (en) * | 1974-12-10 | 1976-06-12 | Fuji Heavy Ind Ltd | KINZOKUZAIR YOTANSHOKINO PUROOBU |
-
1978
- 1978-01-10 JP JP141578U patent/JPS54105588U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5168287A (en) * | 1974-12-10 | 1976-06-12 | Fuji Heavy Ind Ltd | KINZOKUZAIR YOTANSHOKINO PUROOBU |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010038914A (en) * | 2008-07-09 | 2010-02-18 | Toshiba Corp | Remote field eddy current flaw detecting probe |
JP2014178225A (en) * | 2013-03-15 | 2014-09-25 | Neturen Co Ltd | Hardened depth-measuring probe, and hardened depth-measuring method therewith |