JPS539111B2 - - Google Patents

Info

Publication number
JPS539111B2
JPS539111B2 JP1592672A JP1592672A JPS539111B2 JP S539111 B2 JPS539111 B2 JP S539111B2 JP 1592672 A JP1592672 A JP 1592672A JP 1592672 A JP1592672 A JP 1592672A JP S539111 B2 JPS539111 B2 JP S539111B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1592672A
Other languages
Japanese (ja)
Other versions
JPS4885188A (US20090163788A1-20090625-C00002.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1592672A priority Critical patent/JPS539111B2/ja
Publication of JPS4885188A publication Critical patent/JPS4885188A/ja
Publication of JPS539111B2 publication Critical patent/JPS539111B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP1592672A 1972-02-14 1972-02-14 Expired JPS539111B2 (US20090163788A1-20090625-C00002.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1592672A JPS539111B2 (US20090163788A1-20090625-C00002.png) 1972-02-14 1972-02-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1592672A JPS539111B2 (US20090163788A1-20090625-C00002.png) 1972-02-14 1972-02-14

Publications (2)

Publication Number Publication Date
JPS4885188A JPS4885188A (US20090163788A1-20090625-C00002.png) 1973-11-12
JPS539111B2 true JPS539111B2 (US20090163788A1-20090625-C00002.png) 1978-04-03

Family

ID=11902370

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1592672A Expired JPS539111B2 (US20090163788A1-20090625-C00002.png) 1972-02-14 1972-02-14

Country Status (1)

Country Link
JP (1) JPS539111B2 (US20090163788A1-20090625-C00002.png)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01150028U (US20090163788A1-20090625-C00002.png) * 1988-03-31 1989-10-17
JPH0535717Y2 (US20090163788A1-20090625-C00002.png) * 1989-10-30 1993-09-09

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5344077A (en) * 1976-10-04 1978-04-20 Nippon Kokan Kk Method of compensating sensitivity of probe type eddy current flaw detector
JPS5441187A (en) * 1977-09-08 1979-04-02 Nippon Kokan Kk Device for detecting surface flaw of columnar or cylindrical metal
JP5499916B2 (ja) * 2010-06-04 2014-05-21 株式会社ジェイテクト 渦電流式検査装置および渦電流式検査方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3502968A (en) * 1966-05-04 1970-03-24 United Eng Foundry Co Eddy current inductive flatness measurement device
US3611120A (en) * 1970-02-24 1971-10-05 Forster F M O Eddy current testing systems with means to compensate for probe to workpiece spacing

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3502968A (en) * 1966-05-04 1970-03-24 United Eng Foundry Co Eddy current inductive flatness measurement device
US3611120A (en) * 1970-02-24 1971-10-05 Forster F M O Eddy current testing systems with means to compensate for probe to workpiece spacing

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01150028U (US20090163788A1-20090625-C00002.png) * 1988-03-31 1989-10-17
JPH0535717Y2 (US20090163788A1-20090625-C00002.png) * 1989-10-30 1993-09-09

Also Published As

Publication number Publication date
JPS4885188A (US20090163788A1-20090625-C00002.png) 1973-11-12

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