JPS5389262U - - Google Patents
Info
- Publication number
- JPS5389262U JPS5389262U JP17225676U JP17225676U JPS5389262U JP S5389262 U JPS5389262 U JP S5389262U JP 17225676 U JP17225676 U JP 17225676U JP 17225676 U JP17225676 U JP 17225676U JP S5389262 U JPS5389262 U JP S5389262U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17225676U JPS5389262U (enExample) | 1976-12-22 | 1976-12-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17225676U JPS5389262U (enExample) | 1976-12-22 | 1976-12-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5389262U true JPS5389262U (enExample) | 1978-07-21 |
Family
ID=28779760
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17225676U Pending JPS5389262U (enExample) | 1976-12-22 | 1976-12-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5389262U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016096140A (ja) * | 2014-11-12 | 2016-05-26 | エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ | 荷電粒子顕微鏡における非接触温度測定 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50141265A (enExample) * | 1974-04-22 | 1975-11-13 | ||
| JPS517072A (enExample) * | 1974-07-08 | 1976-01-21 | Satsuki Kitani |
-
1976
- 1976-12-22 JP JP17225676U patent/JPS5389262U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50141265A (enExample) * | 1974-04-22 | 1975-11-13 | ||
| JPS517072A (enExample) * | 1974-07-08 | 1976-01-21 | Satsuki Kitani |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016096140A (ja) * | 2014-11-12 | 2016-05-26 | エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ | 荷電粒子顕微鏡における非接触温度測定 |