Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co LtdfiledCriticalNEC Corp
Priority to JP51152377ApriorityCriticalpatent/JPS5951030B2/en
Publication of JPS5375824ApublicationCriticalpatent/JPS5375824A/en
Publication of JPS5951030B2publicationCriticalpatent/JPS5951030B2/en
PURPOSE:To make it possible to effectively detect the faulty zone in the image in the light and shade image which has a stripped pattern like a fingerprint impression.
JP51152377A1976-12-171976-12-17
Image defect area detection device
ExpiredJPS5951030B2
(en)