JPS5367477U - - Google Patents
Info
- Publication number
- JPS5367477U JPS5367477U JP15049876U JP15049876U JPS5367477U JP S5367477 U JPS5367477 U JP S5367477U JP 15049876 U JP15049876 U JP 15049876U JP 15049876 U JP15049876 U JP 15049876U JP S5367477 U JPS5367477 U JP S5367477U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15049876U JPS5367477U (enFirst) | 1976-11-09 | 1976-11-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15049876U JPS5367477U (enFirst) | 1976-11-09 | 1976-11-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5367477U true JPS5367477U (enFirst) | 1978-06-06 |
Family
ID=28758791
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15049876U Pending JPS5367477U (enFirst) | 1976-11-09 | 1976-11-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5367477U (enFirst) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019023627A (ja) * | 2017-07-10 | 2019-02-14 | テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． | 試験測定プローブ及び試験測定プローブの校正方法 |
-
1976
- 1976-11-09 JP JP15049876U patent/JPS5367477U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019023627A (ja) * | 2017-07-10 | 2019-02-14 | テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． | 試験測定プローブ及び試験測定プローブの校正方法 |