JPS5366074U - - Google Patents
Info
- Publication number
- JPS5366074U JPS5366074U JP14635876U JP14635876U JPS5366074U JP S5366074 U JPS5366074 U JP S5366074U JP 14635876 U JP14635876 U JP 14635876U JP 14635876 U JP14635876 U JP 14635876U JP S5366074 U JPS5366074 U JP S5366074U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14635876U JPS6041726Y2 (ja) | 1976-10-29 | 1976-10-29 | 半導体集積回路装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14635876U JPS6041726Y2 (ja) | 1976-10-29 | 1976-10-29 | 半導体集積回路装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5366074U true JPS5366074U (ja) | 1978-06-03 |
JPS6041726Y2 JPS6041726Y2 (ja) | 1985-12-19 |
Family
ID=28754856
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14635876U Expired JPS6041726Y2 (ja) | 1976-10-29 | 1976-10-29 | 半導体集積回路装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6041726Y2 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57211744A (en) * | 1981-06-24 | 1982-12-25 | Hitachi Ltd | Semiconductor integrated circuit device |
JPS617640A (ja) * | 1984-06-22 | 1986-01-14 | Toshiba Corp | 実装集積回路装置の特性試験装置 |
JPS6419739A (en) * | 1988-06-24 | 1989-01-23 | Hitachi Ltd | Semiconductor integrated circuit device |
-
1976
- 1976-10-29 JP JP14635876U patent/JPS6041726Y2/ja not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57211744A (en) * | 1981-06-24 | 1982-12-25 | Hitachi Ltd | Semiconductor integrated circuit device |
JPS617640A (ja) * | 1984-06-22 | 1986-01-14 | Toshiba Corp | 実装集積回路装置の特性試験装置 |
JPS6419739A (en) * | 1988-06-24 | 1989-01-23 | Hitachi Ltd | Semiconductor integrated circuit device |
Also Published As
Publication number | Publication date |
---|---|
JPS6041726Y2 (ja) | 1985-12-19 |