JPS5356079A - Xxray analytical apparatus - Google Patents

Xxray analytical apparatus

Info

Publication number
JPS5356079A
JPS5356079A JP13070176A JP13070176A JPS5356079A JP S5356079 A JPS5356079 A JP S5356079A JP 13070176 A JP13070176 A JP 13070176A JP 13070176 A JP13070176 A JP 13070176A JP S5356079 A JPS5356079 A JP S5356079A
Authority
JP
Japan
Prior art keywords
analytical apparatus
xxray
slit
support
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13070176A
Other languages
Japanese (ja)
Other versions
JPS5426916B2 (en
Inventor
Hiroshi Matsushita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP13070176A priority Critical patent/JPS5356079A/en
Publication of JPS5356079A publication Critical patent/JPS5356079A/en
Publication of JPS5426916B2 publication Critical patent/JPS5426916B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To enable to exchange the detector easily, by installing the spectral diffraction crystal on theta axis and slit on 2theta axis and also, supporting plural detectors on the support, provided on the slit support, at the detector exchange mechanism of X-ray analytical apparatus.
JP13070176A 1976-10-30 1976-10-30 Xxray analytical apparatus Granted JPS5356079A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13070176A JPS5356079A (en) 1976-10-30 1976-10-30 Xxray analytical apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13070176A JPS5356079A (en) 1976-10-30 1976-10-30 Xxray analytical apparatus

Publications (2)

Publication Number Publication Date
JPS5356079A true JPS5356079A (en) 1978-05-22
JPS5426916B2 JPS5426916B2 (en) 1979-09-06

Family

ID=15040542

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13070176A Granted JPS5356079A (en) 1976-10-30 1976-10-30 Xxray analytical apparatus

Country Status (1)

Country Link
JP (1) JPS5356079A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4881891U (en) * 1971-12-29 1973-10-05

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4881891U (en) * 1971-12-29 1973-10-05

Also Published As

Publication number Publication date
JPS5426916B2 (en) 1979-09-06

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