JPS5352154U - - Google Patents
Info
- Publication number
- JPS5352154U JPS5352154U JP13464376U JP13464376U JPS5352154U JP S5352154 U JPS5352154 U JP S5352154U JP 13464376 U JP13464376 U JP 13464376U JP 13464376 U JP13464376 U JP 13464376U JP S5352154 U JPS5352154 U JP S5352154U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Microscoopes, Condenser (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1976134643U JPS5614491Y2 (en:Method) | 1976-10-06 | 1976-10-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1976134643U JPS5614491Y2 (en:Method) | 1976-10-06 | 1976-10-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5352154U true JPS5352154U (en:Method) | 1978-05-04 |
| JPS5614491Y2 JPS5614491Y2 (en:Method) | 1981-04-06 |
Family
ID=28743565
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1976134643U Expired JPS5614491Y2 (en:Method) | 1976-10-06 | 1976-10-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5614491Y2 (en:Method) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010237368A (ja) * | 2009-03-31 | 2010-10-21 | Nikon Corp | 対物レンズ及びこれを有する顕微鏡装置 |
| JP2011007871A (ja) * | 2009-06-23 | 2011-01-13 | Nikon Corp | 実体顕微鏡 |
| JP2011170042A (ja) * | 2010-02-17 | 2011-09-01 | Nikon Corp | 顕微鏡装置 |
| JP2018101134A (ja) * | 2016-12-19 | 2018-06-28 | ライカ インストゥルメンツ （シンガポール） プライヴェット リミテッドＬｅｉｃａ Ｉｎｓｔｒｕｍｅｎｔｓ （Ｓｉｎｇａｐｏｒｅ） Ｐｔｅ． Ｌｔｄ． | 顕微鏡アセンブリまたは内視鏡アセンブリおよび鏡像反射を低減する方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5039145A (en:Method) * | 1973-07-02 | 1975-04-11 |
-
1976
- 1976-10-06 JP JP1976134643U patent/JPS5614491Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5039145A (en:Method) * | 1973-07-02 | 1975-04-11 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010237368A (ja) * | 2009-03-31 | 2010-10-21 | Nikon Corp | 対物レンズ及びこれを有する顕微鏡装置 |
| JP2011007871A (ja) * | 2009-06-23 | 2011-01-13 | Nikon Corp | 実体顕微鏡 |
| JP2011170042A (ja) * | 2010-02-17 | 2011-09-01 | Nikon Corp | 顕微鏡装置 |
| JP2018101134A (ja) * | 2016-12-19 | 2018-06-28 | ライカ インストゥルメンツ （シンガポール） プライヴェット リミテッドＬｅｉｃａ Ｉｎｓｔｒｕｍｅｎｔｓ （Ｓｉｎｇａｐｏｒｅ） Ｐｔｅ． Ｌｔｄ． | 顕微鏡アセンブリまたは内視鏡アセンブリおよび鏡像反射を低減する方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5614491Y2 (en:Method) | 1981-04-06 |