JPS5335407Y2 - - Google Patents
Info
- Publication number
- JPS5335407Y2 JPS5335407Y2 JP1974009865U JP986574U JPS5335407Y2 JP S5335407 Y2 JPS5335407 Y2 JP S5335407Y2 JP 1974009865 U JP1974009865 U JP 1974009865U JP 986574 U JP986574 U JP 986574U JP S5335407 Y2 JPS5335407 Y2 JP S5335407Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1974009865U JPS5335407Y2 (enExample) | 1974-01-21 | 1974-01-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1974009865U JPS5335407Y2 (enExample) | 1974-01-21 | 1974-01-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50100465U JPS50100465U (enExample) | 1975-08-20 |
| JPS5335407Y2 true JPS5335407Y2 (enExample) | 1978-08-30 |
Family
ID=28080296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1974009865U Expired JPS5335407Y2 (enExample) | 1974-01-21 | 1974-01-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5335407Y2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5843533A (ja) * | 1981-09-09 | 1983-03-14 | Hitachi Ltd | ダイオ−ドペレツト極性判定装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS515414B2 (enExample) * | 1971-09-25 | 1976-02-19 |
-
1974
- 1974-01-21 JP JP1974009865U patent/JPS5335407Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS50100465U (enExample) | 1975-08-20 |