JPS5330236A - Memory test method - Google Patents

Memory test method

Info

Publication number
JPS5330236A
JPS5330236A JP10523676A JP10523676A JPS5330236A JP S5330236 A JPS5330236 A JP S5330236A JP 10523676 A JP10523676 A JP 10523676A JP 10523676 A JP10523676 A JP 10523676A JP S5330236 A JPS5330236 A JP S5330236A
Authority
JP
Japan
Prior art keywords
test method
memory test
meq
neq
fault
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10523676A
Other languages
English (en)
Japanese (ja)
Other versions
JPS578557B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Seishichi Kishi
Noboru Onishi
Tadashi Kawanobe
Yoshikatsu Otsu
Toshio Oma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Fujitsu Ltd
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Nippon Telegraph and Telephone Corp filed Critical Fujitsu Ltd
Priority to JP10523676A priority Critical patent/JPS5330236A/ja
Publication of JPS5330236A publication Critical patent/JPS5330236A/ja
Publication of JPS578557B2 publication Critical patent/JPS578557B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP10523676A 1976-09-02 1976-09-02 Memory test method Granted JPS5330236A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10523676A JPS5330236A (en) 1976-09-02 1976-09-02 Memory test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10523676A JPS5330236A (en) 1976-09-02 1976-09-02 Memory test method

Publications (2)

Publication Number Publication Date
JPS5330236A true JPS5330236A (en) 1978-03-22
JPS578557B2 JPS578557B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1982-02-17

Family

ID=14402008

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10523676A Granted JPS5330236A (en) 1976-09-02 1976-09-02 Memory test method

Country Status (1)

Country Link
JP (1) JPS5330236A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102704976B1 (ko) * 2020-04-13 2024-09-09 주식회사 엘지에너지솔루션 전극의 품질 평가 방법 및 전극의 제조 방법

Also Published As

Publication number Publication date
JPS578557B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1982-02-17

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