JPS5329784A - Method and apparatus for measuring refractive index - Google Patents

Method and apparatus for measuring refractive index

Info

Publication number
JPS5329784A
JPS5329784A JP10466076A JP10466076A JPS5329784A JP S5329784 A JPS5329784 A JP S5329784A JP 10466076 A JP10466076 A JP 10466076A JP 10466076 A JP10466076 A JP 10466076A JP S5329784 A JPS5329784 A JP S5329784A
Authority
JP
Japan
Prior art keywords
refractive index
measuring refractive
measuring
kinds
carry out
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10466076A
Other languages
Japanese (ja)
Other versions
JPS5513542B2 (en
Inventor
Kenji Iwahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP10466076A priority Critical patent/JPS5329784A/en
Publication of JPS5329784A publication Critical patent/JPS5329784A/en
Publication of JPS5513542B2 publication Critical patent/JPS5513542B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To carry out convenient measurement for refractive index using small specimen, by measuring Moire interference frings with two kinds of medium whose refractive indexes are known.
JP10466076A 1976-08-31 1976-08-31 Method and apparatus for measuring refractive index Granted JPS5329784A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10466076A JPS5329784A (en) 1976-08-31 1976-08-31 Method and apparatus for measuring refractive index

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10466076A JPS5329784A (en) 1976-08-31 1976-08-31 Method and apparatus for measuring refractive index

Publications (2)

Publication Number Publication Date
JPS5329784A true JPS5329784A (en) 1978-03-20
JPS5513542B2 JPS5513542B2 (en) 1980-04-09

Family

ID=14386609

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10466076A Granted JPS5329784A (en) 1976-08-31 1976-08-31 Method and apparatus for measuring refractive index

Country Status (1)

Country Link
JP (1) JPS5329784A (en)

Also Published As

Publication number Publication date
JPS5513542B2 (en) 1980-04-09

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