JPS5328467Y2 - - Google Patents
Info
- Publication number
- JPS5328467Y2 JPS5328467Y2 JP1972037485U JP3748572U JPS5328467Y2 JP S5328467 Y2 JPS5328467 Y2 JP S5328467Y2 JP 1972037485 U JP1972037485 U JP 1972037485U JP 3748572 U JP3748572 U JP 3748572U JP S5328467 Y2 JPS5328467 Y2 JP S5328467Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1972037485U JPS5328467Y2 (en) | 1972-03-30 | 1972-03-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1972037485U JPS5328467Y2 (en) | 1972-03-30 | 1972-03-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS48112392U JPS48112392U (en) | 1973-12-22 |
JPS5328467Y2 true JPS5328467Y2 (en) | 1978-07-18 |
Family
ID=27905966
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1972037485U Expired JPS5328467Y2 (en) | 1972-03-30 | 1972-03-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5328467Y2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008123035A1 (en) * | 2007-03-26 | 2008-10-16 | Sumitomo Metal Industries, Ltd. | Eddy current examination method, and eddy current examination apparatus |
WO2010134510A1 (en) * | 2009-05-22 | 2010-11-25 | 住友金属工業株式会社 | Rotating eddy current test probe |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3276295B2 (en) * | 1996-10-09 | 2002-04-22 | 三菱重工業株式会社 | Eddy current flaw detector |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS424077Y1 (en) * | 1965-02-05 | 1967-03-07 |
-
1972
- 1972-03-30 JP JP1972037485U patent/JPS5328467Y2/ja not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS424077Y1 (en) * | 1965-02-05 | 1967-03-07 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008123035A1 (en) * | 2007-03-26 | 2008-10-16 | Sumitomo Metal Industries, Ltd. | Eddy current examination method, and eddy current examination apparatus |
WO2010134510A1 (en) * | 2009-05-22 | 2010-11-25 | 住友金属工業株式会社 | Rotating eddy current test probe |
JP2011007780A (en) * | 2009-05-22 | 2011-01-13 | Marktec Corp | Rotating eddy current flaw detection probe |
Also Published As
Publication number | Publication date |
---|---|
JPS48112392U (en) | 1973-12-22 |