JPS5317171U - - Google Patents
Info
- Publication number
- JPS5317171U JPS5317171U JP8206176U JP8206176U JPS5317171U JP S5317171 U JPS5317171 U JP S5317171U JP 8206176 U JP8206176 U JP 8206176U JP 8206176 U JP8206176 U JP 8206176U JP S5317171 U JPS5317171 U JP S5317171U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8206176U JPS5619738Y2 (en:Method) | 1976-06-22 | 1976-06-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8206176U JPS5619738Y2 (en:Method) | 1976-06-22 | 1976-06-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5317171U true JPS5317171U (en:Method) | 1978-02-14 |
| JPS5619738Y2 JPS5619738Y2 (en:Method) | 1981-05-11 |
Family
ID=28695527
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8206176U Expired JPS5619738Y2 (en:Method) | 1976-06-22 | 1976-06-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5619738Y2 (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0341788U (en:Method) * | 1989-08-31 | 1991-04-22 |
-
1976
- 1976-06-22 JP JP8206176U patent/JPS5619738Y2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0341788U (en:Method) * | 1989-08-31 | 1991-04-22 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5619738Y2 (en:Method) | 1981-05-11 |