Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu CorpfiledCriticalShimadzu Corp
Priority to JP5014477ApriorityCriticalpatent/JPS6026180B2/en
Publication of JPS53135376ApublicationCriticalpatent/JPS53135376A/en
Publication of JPS6026180B2publicationCriticalpatent/JPS6026180B2/en
Investigating Or Analyzing Materials By The Use Of Magnetic Means
(AREA)
Abstract
PURPOSE: To simultaneously improve flaw detecting ability and flaw detecting performance and eneble kinds of flaws to be classfied and detected disporsing magnetic cores in multiplex on plural equal magnetic potential lines near the detecting coils installed in proximity to the material to be examined.
COPYRIGHT: (C)1978,JPO&Japio
JP5014477A1977-04-301977-04-30
Electromagnetic non-destructive testing method and device
ExpiredJPS6026180B2
(en)