JPS53124440A - Electrophotographic method - Google Patents
Electrophotographic methodInfo
- Publication number
- JPS53124440A JPS53124440A JP12845074A JP12845074A JPS53124440A JP S53124440 A JPS53124440 A JP S53124440A JP 12845074 A JP12845074 A JP 12845074A JP 12845074 A JP12845074 A JP 12845074A JP S53124440 A JPS53124440 A JP S53124440A
- Authority
- JP
- Japan
- Prior art keywords
- electrophotographic method
- providing
- long life
- obtain good
- specific insulation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To obtain good images of a long life by providing a specific insulation layer on a photoconductive layer.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12845074A JPS53124440A (en) | 1974-11-07 | 1974-11-07 | Electrophotographic method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12845074A JPS53124440A (en) | 1974-11-07 | 1974-11-07 | Electrophotographic method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS53124440A true JPS53124440A (en) | 1978-10-30 |
Family
ID=14985002
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12845074A Pending JPS53124440A (en) | 1974-11-07 | 1974-11-07 | Electrophotographic method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53124440A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107388994A (en) * | 2017-06-14 | 2017-11-24 | 武汉华星光电技术有限公司 | A kind of method and device for measuring polysilicon roughness |
-
1974
- 1974-11-07 JP JP12845074A patent/JPS53124440A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107388994A (en) * | 2017-06-14 | 2017-11-24 | 武汉华星光电技术有限公司 | A kind of method and device for measuring polysilicon roughness |
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