JPS5310413B2 - - Google Patents

Info

Publication number
JPS5310413B2
JPS5310413B2 JP10257074A JP10257074A JPS5310413B2 JP S5310413 B2 JPS5310413 B2 JP S5310413B2 JP 10257074 A JP10257074 A JP 10257074A JP 10257074 A JP10257074 A JP 10257074A JP S5310413 B2 JPS5310413 B2 JP S5310413B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10257074A
Other languages
Japanese (ja)
Other versions
JPS5185355A (cg-RX-API-DMAC7.html
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10257074A priority Critical patent/JPS5310413B2/ja
Priority to US05/567,466 priority patent/US4028587A/en
Publication of JPS5185355A publication Critical patent/JPS5185355A/ja
Publication of JPS5310413B2 publication Critical patent/JPS5310413B2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/15Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements (indicating that pulse width is above or below a certain limit)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • G01R13/20Cathode-ray oscilloscopes
    • G01R13/22Circuits therefor
    • G01R13/30Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
JP10257074A 1974-09-06 1974-09-06 Expired JPS5310413B2 (cg-RX-API-DMAC7.html)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP10257074A JPS5310413B2 (cg-RX-API-DMAC7.html) 1974-09-06 1974-09-06
US05/567,466 US4028587A (en) 1974-09-06 1975-04-14 Marker circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10257074A JPS5310413B2 (cg-RX-API-DMAC7.html) 1974-09-06 1974-09-06

Publications (2)

Publication Number Publication Date
JPS5185355A JPS5185355A (cg-RX-API-DMAC7.html) 1976-07-26
JPS5310413B2 true JPS5310413B2 (cg-RX-API-DMAC7.html) 1978-04-13

Family

ID=14330872

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10257074A Expired JPS5310413B2 (cg-RX-API-DMAC7.html) 1974-09-06 1974-09-06

Country Status (2)

Country Link
US (1) US4028587A (cg-RX-API-DMAC7.html)
JP (1) JPS5310413B2 (cg-RX-API-DMAC7.html)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4354277A (en) * 1979-11-23 1982-10-12 Trw Inc. Signal acquisition system
JPS5860263A (ja) * 1981-10-05 1983-04-09 Meguro Denpa Sokki Kk マ−カ信号発生方法
US5434954A (en) * 1990-03-30 1995-07-18 Anritsu Corporation Waveform display apparatus for easily realizing high-definition waveform observation
US20060070698A1 (en) * 2002-12-03 2006-04-06 Integrated Paving Concepts Inc. Method of applying a thermally settable coating to a patterned substrate
US8133540B2 (en) * 2002-12-03 2012-03-13 Flint Trading, Inc. Method of applying a thermally settable coating to a patterned substrate
RU2338211C2 (ru) * 2006-08-11 2008-11-10 Открытое акционерное общество "Концерн "Ижмаш" Устройство для контроля периода (частоты) следования импульсов по пороговому значению
RU2384849C1 (ru) * 2009-02-09 2010-03-20 Александр Сергеевич Мелешин Устройство обнаружения и оценивания ступенчатых вариаций интенсивности потока импульсов
RU2439591C1 (ru) * 2010-11-01 2012-01-10 Мария Валерьевна Хуторцева Устройство мониторинга импульсных потоков
EP3395406A1 (en) 2017-04-28 2018-10-31 EFSEN Engineering A/S A system and a method for irradiating an object

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3500369A (en) * 1966-06-27 1970-03-10 Singer General Precision Pulse width error detector
US3515996A (en) * 1966-12-14 1970-06-02 Western Electric Co Circuit for determining when a sweep frequency is substantially equal to a standard frequency
US3596193A (en) * 1968-03-27 1971-07-27 Wiltron Co Sweep oscillator with intensity frequency marker
US3611157A (en) * 1969-06-09 1971-10-05 Us Navy Pulse width discriminator
US3772534A (en) * 1972-04-06 1973-11-13 Us Air Force Low power, high speed, pulse width discriminator

Also Published As

Publication number Publication date
JPS5185355A (cg-RX-API-DMAC7.html) 1976-07-26
US4028587A (en) 1977-06-07

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