JPS5282859U - - Google Patents
Info
- Publication number
- JPS5282859U JPS5282859U JP17138275U JP17138275U JPS5282859U JP S5282859 U JPS5282859 U JP S5282859U JP 17138275 U JP17138275 U JP 17138275U JP 17138275 U JP17138275 U JP 17138275U JP S5282859 U JPS5282859 U JP S5282859U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17138275U JPS5282859U (en) | 1975-12-18 | 1975-12-18 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17138275U JPS5282859U (en) | 1975-12-18 | 1975-12-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5282859U true JPS5282859U (en) | 1977-06-21 |
Family
ID=28649846
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17138275U Pending JPS5282859U (en) | 1975-12-18 | 1975-12-18 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5282859U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5530872A (en) * | 1978-08-28 | 1980-03-04 | Fujitsu Ltd | Method of inspecting printed board pattern |
JPS5855841A (en) * | 1981-09-30 | 1983-04-02 | Fujitsu Ltd | Device for detecting pattern defect |
-
1975
- 1975-12-18 JP JP17138275U patent/JPS5282859U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5530872A (en) * | 1978-08-28 | 1980-03-04 | Fujitsu Ltd | Method of inspecting printed board pattern |
JPS5855841A (en) * | 1981-09-30 | 1983-04-02 | Fujitsu Ltd | Device for detecting pattern defect |