JPS5280006A - Pickup cantilever - Google Patents

Pickup cantilever

Info

Publication number
JPS5280006A
JPS5280006A JP15666175A JP15666175A JPS5280006A JP S5280006 A JPS5280006 A JP S5280006A JP 15666175 A JP15666175 A JP 15666175A JP 15666175 A JP15666175 A JP 15666175A JP S5280006 A JPS5280006 A JP S5280006A
Authority
JP
Japan
Prior art keywords
cantilever
pickup
pickup cantilever
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15666175A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5441882B2 (enExample
Inventor
Shinichi Suzuki
Nobuhiro Tsukagoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Electronic Corp filed Critical Pioneer Electronic Corp
Priority to JP15666175A priority Critical patent/JPS5280006A/ja
Publication of JPS5280006A publication Critical patent/JPS5280006A/ja
Publication of JPS5441882B2 publication Critical patent/JPS5441882B2/ja
Granted legal-status Critical Current

Links

JP15666175A 1975-12-26 1975-12-26 Pickup cantilever Granted JPS5280006A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15666175A JPS5280006A (en) 1975-12-26 1975-12-26 Pickup cantilever

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15666175A JPS5280006A (en) 1975-12-26 1975-12-26 Pickup cantilever

Publications (2)

Publication Number Publication Date
JPS5280006A true JPS5280006A (en) 1977-07-05
JPS5441882B2 JPS5441882B2 (enExample) 1979-12-11

Family

ID=15632524

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15666175A Granted JPS5280006A (en) 1975-12-26 1975-12-26 Pickup cantilever

Country Status (1)

Country Link
JP (1) JPS5280006A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2036096A4 (en) * 2006-06-02 2009-12-02 Victor B Kley SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS, ANALYSIS AND OBTAINING HIGH-SPEED IMAGES IN THE RANGE OF THE METER TO THE SUB-NANOMETER
US8776261B2 (en) 2005-05-10 2014-07-08 Victor B. Kley Tool tips with scanning probe microscopy and/or atomic force microscopy applications
US9423693B1 (en) 2005-05-10 2016-08-23 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate
US10042263B1 (en) 2013-03-15 2018-08-07 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49105502A (en) * 1973-02-07 1974-10-05 Matsushita Electric Industrial Co Ltd Cantilever for pickups

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49105502A (en) * 1973-02-07 1974-10-05 Matsushita Electric Industrial Co Ltd Cantilever for pickups

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8776261B2 (en) 2005-05-10 2014-07-08 Victor B. Kley Tool tips with scanning probe microscopy and/or atomic force microscopy applications
US9423693B1 (en) 2005-05-10 2016-08-23 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate
EP2036096A4 (en) * 2006-06-02 2009-12-02 Victor B Kley SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS, ANALYSIS AND OBTAINING HIGH-SPEED IMAGES IN THE RANGE OF THE METER TO THE SUB-NANOMETER
US10042263B1 (en) 2013-03-15 2018-08-07 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate

Also Published As

Publication number Publication date
JPS5441882B2 (enExample) 1979-12-11

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