JPS5267384A - Reflectance and transmissivity meter - Google Patents

Reflectance and transmissivity meter

Info

Publication number
JPS5267384A
JPS5267384A JP14375775A JP14375775A JPS5267384A JP S5267384 A JPS5267384 A JP S5267384A JP 14375775 A JP14375775 A JP 14375775A JP 14375775 A JP14375775 A JP 14375775A JP S5267384 A JPS5267384 A JP S5267384A
Authority
JP
Japan
Prior art keywords
reflectance
transmissivity
light source
meter
transmissivity meter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14375775A
Other languages
English (en)
Other versions
JPS5853731B2 (ja
Inventor
Shinichi Shirasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Citizen Watch Co Ltd
Original Assignee
Citizen Watch Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Citizen Watch Co Ltd filed Critical Citizen Watch Co Ltd
Priority to JP50143757A priority Critical patent/JPS5853731B2/ja
Publication of JPS5267384A publication Critical patent/JPS5267384A/ja
Publication of JPS5853731B2 publication Critical patent/JPS5853731B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP50143757A 1975-12-01 1975-12-01 反射率透過率測定装置 Expired JPS5853731B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50143757A JPS5853731B2 (ja) 1975-12-01 1975-12-01 反射率透過率測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50143757A JPS5853731B2 (ja) 1975-12-01 1975-12-01 反射率透過率測定装置

Publications (2)

Publication Number Publication Date
JPS5267384A true JPS5267384A (en) 1977-06-03
JPS5853731B2 JPS5853731B2 (ja) 1983-12-01

Family

ID=15346301

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50143757A Expired JPS5853731B2 (ja) 1975-12-01 1975-12-01 反射率透過率測定装置

Country Status (1)

Country Link
JP (1) JPS5853731B2 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012141311A (ja) * 2010-12-30 2012-07-26 Samsung Corning Precision Materials Co Ltd パターンドガラス基板の透過率測定装置
JP2013246037A (ja) * 2012-05-25 2013-12-09 Seiko Epson Corp 光計測装置及び計測光制御方法
CN105699336A (zh) * 2016-03-24 2016-06-22 深圳怡化电脑股份有限公司 一种检测可透光介质透光率的方法、系统及装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012141311A (ja) * 2010-12-30 2012-07-26 Samsung Corning Precision Materials Co Ltd パターンドガラス基板の透過率測定装置
US9030664B2 (en) 2010-12-30 2015-05-12 Samsung Corning Precision Materials Co., Ltd. Apparatus for measuring transmissivity of patterned glass substrate
JP2013246037A (ja) * 2012-05-25 2013-12-09 Seiko Epson Corp 光計測装置及び計測光制御方法
CN105699336A (zh) * 2016-03-24 2016-06-22 深圳怡化电脑股份有限公司 一种检测可透光介质透光率的方法、系统及装置

Also Published As

Publication number Publication date
JPS5853731B2 (ja) 1983-12-01

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